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LM5161-Q1 Datasheet(PDF) 4 Page - Texas Instruments |
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LM5161-Q1 Datasheet(HTML) 4 Page - Texas Instruments |
4 / 37 page 4 LM5161-Q1 SNVSAF9 – AUGUST 2016 www.ti.com Product Folder Links: LM5161-Q1 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated 6 Specifications 6.1 Absolute Maximum Ratings MIN MAX UNIT Input voltage VIN to AGND –0.3 100 V EN/UVLO to AGND –0.3 100 RON to AGND –0.3 100 BST to AGND –0.3 114 VCC to AGND –0.3 14 FPWM to AGND –0.3 14 SS to AGND –0.3 7 FB to AGND –0.3 7 Output voltage BST to SW –0.3 14 V BST to VCC 100 SW to AGND –1.5 100 SW to AGND (20 ns transient) –3 Lead Temperature(4) 200 °C Maximum Junction Temperature(3) –40 150 Storage temperature Tstg –65 150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions . Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and specifications. (3) High junction temperatures degrade operating lifetimes. Operating lifetime is de-rated for junction temperatures greater than 125°C. (4) For detailed information on soldering plastic SO PowerPAD package, refer to the SNOA549 available from Texas Instruments. Maximum solder time not to exceed 4 seconds. (1) AEC Q100-002 indicates HBM stressing is done in accordance with the ANSI/ESDA/JEDEC JS-001 specification. Level listed above is the passing level per ANSI/ESDA/JEDEC JS-001. JEDEC document JEP155 states that 500 V HBM allows safe manufacturing with a standard ESD control process. 6.2 ESD Ratings: LM5161-Q1 VALUE UNIT V(ESD) Human body model (HBM), per AEC Q100-002(1) ±2000 V Charged device model (CDM), per AEC Q100-011 ±750 V (1) Operating Ratings are conditions under the device is intended to be functional. For specifications and test conditions, see Electrical Characteristics (2) High junction temperatures degrade operating lifetimes. Operating lifetime is de-rated for junction temperatures greater than 125°C. 6.3 Recommended Operating Conditions (1) Over operating free-air temperature range (unless otherwise noted) MIN NOM MAX UNIT VIN input voltage 4.5 100 V IO output current 1 A External VCC bias voltage 9 13 V Operating junction temperature(2) –40 150 °C |
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