NCS333, NCV333, NCS2333, NCV2333, NCS4333, NCV4333

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4

ABSOLUTE MAXIMUM RATINGS

Over operating free−air temperature, unless otherwise stated.

Parameter

Rating

Unit

Supply Voltage

7

V

INPUT AND OUTPUT PINS

Input Voltage (Note 1)

(VSS) − 0.3 to (VDD) + 0.3

V

Input Current (Note 1)

±10

mA

Output Short Circuit Current (Note 2)

Continuous

TEMPERATURE

Operating Temperature Range

−40 to +125

°C

Storage Temperature Range

−65 to +150

°C

Junction Temperature

+150

°C

ESD RATINGS (Note 3)

Human Body Model (HBM)

4000

V

Machine Model (MM)

200

V

Charged Device Model (CDM)

2000

V

OTHER RATINGS

Latch−up Current (Note 4)

100

mA

MSL

Level 1

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality

should not be assumed, damage may occur and reliability may be affected.

1. Input terminals are diode−clamped to the power−supply rails. Input signals that can swing more than 0.3 V beyond the supply rails should

be current limited to 10 mA or less

2. Short−circuit to ground.

3. This device series incorporates ESD protection and is tested by the following methods:

ESD Human Body Model tested per AEC−Q100−002 (JEDEC standard: JESD22−A114)

ESD Machine Model tested per AEC−Q100−003 (JEDEC standard: JESD22−A115)

4. Latch−up Current tested per JEDEC standard: JESD78.

Parameter

Symbol

Package

Value

Unit

Thermal Resistance,

Junction to Ambient

SOT23−5 / TSOP5

290

°C/W

SC70−5 / SC−88−5 / SOT−353−5

425

Micro8 / MSOP8

298

SOIC−8

250

DFN−8

130

SOIC−14

216

51.1, 51.2, 51.3 test guidelines

RECOMMENDED OPERATING CONDITIONS

Parameter

Symbol

Range

Unit

1.8 to 5.5

V

Specified Operating Range

NCS333

−40 to 105

°C

NCS333A, NCV333, NCx2333, NCx4333

−40 to 125

Input Common Mode Voltage Range

V

Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond

the Recommended Operating Ranges limits may affect device reliability.