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N1422A Datasheet(PDF) 4 Page - Keysight Technologies |
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N1422A Datasheet(HTML) 4 Page - Keysight Technologies |
4 / 16 page 04 | Keysight | B2980A Series Femto/Picoammeter and Electrometer/High Resistance Meter - Data Sheet Solution 1. The B2980A series’ time domain view (Roll View) lets you visually choose when to capture data. The B2980A series’ GUI provides a Roll View that can graphically display data as it is taken and that also can store up to 100,000 of these data points for later retrieval. With a sampling rate of up to 100 kHz, the Roll View can reveal real-time measurement trends and provide valuable insights into the dynamics of your DUT’s behavior. To facilitate this data analysis, the B2980A series provides flexible graphing capabilities. In Graph View the electrometers can plot I-V curves on their displays using values from either the internal voltage source or voltage measurement data. In addition, it is easy to generate a variety of other X-Y plots such as I-t, V-t, R-t, Q-t, I-R, etc. (specific graphical display capabilities depend on product model). These powerful and versatile graphical capabilities allow you to gain valuable insights when making sensitive measurements. How fast can the B2980A series capture data? Measurement speed is usually determined by the aperture time of the integration setting, which is typi- cally proportional to some number of power line cycles (PLCs). Smaller aperture times are obviously more desirable as long as they provide sufficient averaging to prevent power line noise from affecting the measurement. However, conventional instruments often cannot capture fast transients due to their relatively slow reading rates that require long overhead after the aperture closes. In contrast, the B2980A series’ fast reading rate (20,000 rdg/s) and streamlined system architecture greatly reduce overhead time. As a result the B2980A series does not lose data sampling capability even in its minimum PLC setting, allowing it to capture more detailed DUT responses. The example below compares the data sampling capability of a conventional instrument with that of the B2980A series. As this example shows, the B2980A series can capture data with x4 better timing resolution due to its low measurement overhead. Original waveform Conventional instrument Keysight B2980A series Time domain view (Roll View) Data recorded up to 100,000 points The B2980A series’ unmatched 0.01 fA resolution combines with other unique features to solve previously intractable measurement challenges Solution 2. You can instantly view and evaluate data distributions using the real-time histogram feature All low-level measurements carry with them a degree of statistical uncertainty due to inherent fluctuations in the measurement environment. The conventional method to deal with this issue involves post-measurement evaluation of the data (usually on a PC) using a histogram. However, this process can become tedious if you need to perform several measurement and test setup debug cycles. Challenge 2: Instruments with only numeric displays often exhibit instability in their least significant digits and offer no information about the measurement’s mean and standard deviation. How does the measurement result distribute? Challenge 1: Instruments that only have numeric displays do not give you any control over when to take data during a transient response. RUN RUN RUN RUN When should I take the measurement data? When should I take the measurement data? |
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