VCC

18

GND

17

RF_OUT

16

15

14

GND

13

1

2

GND

3

LOP

4

LON

GND

5

6

0/90

S

NC

NC

B0175-01

NC

NC

TRF370315

TRF370333

SLWS184J

– MARCH 2006 – REVISED MAY 2011

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

FUNCTIONAL BLOCK DIAGRAM

NOTE: NC = No connection

2

Copyright

© 2006–2011, Texas Instruments Incorporated