Data Sheet

8

Rev. 1.0, 2013-02-25

IFX1963

General Product Characteristics

4

General Product Characteristics

4.1

Absolute Maximum Ratings

Note: Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute

maximum rating conditions for extended periods may affect device reliability.

Note: Integrated protection functions are designed to prevent IC destruction under fault conditions described in the

data sheet. Fault conditions are considered as “outside” normal operating range. Protection functions are

not designed for continuous repetitive operation.

Table 1

T

1) Not subject to production test, specified by design.

Pos.

Parameter

Symbol

Limit Values

Unit

Conditions

Min.

Max.

Input, Enable

4.1.1

Voltage

V

-20

20

V

–

Adjust

4.1.2

Voltage

V

ADJ

-7

7

V

–

Output

4.1.3

Voltage

V

OUT

-20

20

V

–

Temperatures

4.1.4

Junction Temperature

T

j

-40

150

°C–

4.1.5

Storage Temperature

T

stg

-50

150

°C–

ESD Susceptibility

4.1.6

ESD Resistivity

V

ESD

-2

2

kV

2) ESD susceptibility, HBM according to ANSI/ESDA/JEDEC JS001 (1.5k

4.1.7

ESD Resistivity

V

ESD

-750

750

V

3) ESD susceptibility, Charged Device Model “CDM” according JEDEC JESD22-C101