ISO7240CF-Q1, ISO7240C-Q1

ISO7241C-Q1, ISO7242C-Q1

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SLLSE40A

– SEPTEMBER 2010 – REVISED SEPTEMBER 2011

over recommended operating conditions (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MA

UNIT

X

Propagation delay

See Figure 1

20

51

ISO7240C,

ns

3

ISO7241C

PWD

See Figure 1

ISO7242C

4

10

ns

ISO7240C, ISO7241C

3

ns

ISO7242C

4

Output signal rise time

2

See Figure 1

ns

Output signal fall time

2

Propagation delay,

15

25

high-level-to-high-impedance output

Propagation delay,

15

25

high-impedance-to-high-level output

See Figure 2

ns

Propagation delay, low-level-to-high-impedance

15

25

output

Propagation delay, high-impedance-to-low-level

15

25

output

Failsafe output delay time from input power loss

See Figure 3

12

μs

Wake time from input disable

See Figure 4

15

μs

(1)

Also known as pulse skew

(2)

operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.

(3)

same direction while driving identical specified loads.

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© 2010–2011, Texas Instruments Incorporated

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