ISO721-Q1, ISO722-Q1

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SLLS918C – JULY 2008 – REVISED JUNE 2013

over recommended operating conditions (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Quiescent

0.3

0.5

mA

25 Mbps

1

2

ISO722-Q1

200

μA

Sleep Mode

EN at 0 V or ISO721-

Quiescent

8

12

Q1

mA

25 Mbps

10

14

4.6

High-level output voltage

V

5

0.2

0.4

Low-level output voltage

V

0

0.1

Input voltage hysteresis

150

mV

High-level input current

IN at 2 V

10

μA

Low-level input current

IN at 0.8 V

–10

μA

High-impedance output

ISO722-Q1

1

μA

current

Input capacitance to ground

1

pF

CMTI

Common-mode transient immunity

15

40

kV/

μs

(1)

over recommended operating conditions (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP MAX UNIT

Propagation delay, low-to-high-level output

See Figure 1

17

30

ns

Propagation delay , high-to-low-level output

See Figure 1

17

30

ns

See Figure 1

0.5

3

ns

Part-to-part skew

0

5

ns

(1)

Output signal rise time

See Figure 1

2

ns

Output signal fall time

See Figure 1

2

ns

Sleep-mode propagation delay,

7

9

15

ns

high-level-to-high-impedance output

See Figure 2

Sleep-mode propagation delay,

4.5

5

8

μs

high-impedance-to-high-level output

ISO722-Q1

Sleep-mode propagation delay,

7

9

15

ns

low-level-to-high-impedance output

See Figure 3

Sleep-mode propagation delay,

4.5

5

8

μs

high-impedance-to-low-level output

Failsafe output delay time from input power loss

See Figure 4

3

μs

100-Mbps NRZ data input,

2

See Figure 6

Peak-to-peak eye-pattern jitter

ns

100-Mbps unrestricted bit

run length data input, See

3

Figure 6

(1)

operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.

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