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LV52204MUTBG Datasheet(PDF) 2 Page - ON Semiconductor |
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LV52204MUTBG Datasheet(HTML) 2 Page - ON Semiconductor |
2 / 16 page LV52204MU No.A2176-2/16 Specifications Absolute Maximum Ratings at Ta = 25 °C Parameter Symbol Conditions Ratings Unit Maximum supply voltage VCC max VCC 5.5 V Maximum pin voltage1 V1 max SW 40 V Maximum pin voltage2 V2 max Other pin 5.5 V Allowable power dissipation Pd max Ta = 25 °C *1 2.05 W Operating temperature Topr -30 to +85 °C Storage temperature Tstg -55 to +125 °C *1 Mounted on a specified board: 70mm ×50mm×1.2mm (4 layer glass epoxy) Caution 1) Absolute maximum ratings represent the values which cannot be exceeded for any length of time. Caution 2) Even when the device is used within the range of absolute maximum ratings, as a result of continuous usage under high temperature, high current, high voltage, or drastic temperature change, the reliability of the IC may be degraded. Please contact us for the further details. Recommendation Operating Condition at Ta = 25 °C Parameter Symbol Conditions Ratings Unit Supply voltage range1 VCC op VCC 2.7 to 5.5 V PWM frequency Fpwm PWM MODE 300 to 100k Hz Electrical Characteristics Analog block at Ta = 25°C, VCC = 3.6V, unless otherwise specified Parameter Symbol Conditions Ratings Unit min typ max Standby current dissipation ICC1 SHUTDOWN 0 5 μA DC/DC current dissipation ICC2 VOUT = 30V, ILED = 20mA 1 mA FB voltage Vfb PWM duty 100% 0.19 0.2 0.21 V FB pin leak current Ifb 1 μA OVP voltage Vovp SW 37 38 39 V SWOUT ON resistance Ron IL = 100mA 700 m Ω NMOS switch current limit ILIM Vfb = 200mV 0.7 A OSC frequency Fosc 600 kHz High level input voltage VINH SWIRE 1.5 VCC V Low level input voltage VINL SWIRE 0 0.4 V Under voltage lockout Vuvlo VIN falling 2.2 V SWIRE output voltage for Acknowledge Vack Rpullup = 15k Ω 0.4 V Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability. Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. |
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