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LF147 Datasheet(PDF) 3 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor. Click here to check the latest version.
Part No. LF147
Description  Wide Bandwidth Quad JFET Input Operational Amplifiers
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Maker  NSC [National Semiconductor (TI)]
Homepage  http://www.national.com
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LF147 Datasheet(HTML) 3 Page - National Semiconductor (TI)

 
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AC Electrical Characteristics (Note 7)
Symbol
Parameter
Conditions
LF147
LF347B
LF347
Units
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Amplifier to Amplifier Coupling
TA=25˚C,
−120
−120
−120
dB
f=1 Hz−20 kHz
(Input Referred)
SR
Slew Rate
VS=±15V, TA=25˚C
8
13
8
13
8
13
V/µs
GBW
Gain-Bandwidth Product
VS=±15V, TA=25˚C
2.2
4
2.2
4
2.2
4
MHz
en
Equivalent Input Noise Voltage
TA=25˚C, RS=100Ω,
202020
f=1000 Hz
in
Equivalent Input Noise Current
Tj=25˚C, f=1000 Hz
0.01
0.01
0.01
Note 2: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is func-
tional, but do not guarantee specific performance limits.
Note 3: Unless otherwise specified the absolute maximum negative input voltage is equal to the negative power supply voltage.
Note 4: Any of the amplifier outputs can be shorted to ground indefinitely, however, more than one should not be simultaneously shorted as the maximum junction
temperature will be exceeded.
Note 5: For operating at elevated temperature, these devices must be derated based on a thermal resistance of
θjA.
Note 6: The LF147 is available in the military temperature range −55˚C
≤TA≤125˚C, while the LF347B and the LF347 are available in the commercial temperature
range 0˚C
≤TA≤70˚C. Junction temperature can rise to Tj max = 150˚C.
Note 7: Unless otherwise specified the specifications apply over the full temperature range and for VS=±20V for the LF147 and for VS=±15V for the LF347B/LF347.
VOS,IB, and IOS are measured at VCM=0.
Note 8: The input bias currents are junction leakage currents which approximately double for every 10˚C increase in the junction temperature, Tj. Due to limited pro-
duction test time, the input bias currents measured are correlated to junction temperature. In normal operation the junction temperature rises above the ambient tem-
perature as a result of internal power dissipation, PD.Tj=TAjA PD where θjA is the thermal resistance from junction to ambient. Use of a heat sink is recommended
if input bias current is to be kept to a minimum.
Note 9: Supply voltage rejection ratio is measured for both supply magnitudes increasing or decreasing simultaneously in accordance with common practice from
VS = ± 5V to ±15V for the LF347 and LF347B and from VS = ±20V to ±5V for the LF147.
Note 10: Refer to RETS147X for LF147D and LF147J military specifications.
Note 11: Max. Power Dissipation is defined by the package characteristics. Operating the part near the Max. Power Dissipation may cause the part to operate out-
side guaranteed limits.
Note 12: Human body model, 1.5 k
Ω in series with 100 pF.
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