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P83C557E4 Datasheet(PDF) 67 Page - NXP Semiconductors |
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P83C557E4 Datasheet(HTML) 67 Page - NXP Semiconductors |
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67 / 72 page  Philips Semiconductors Product specification P83C557E4/P80C557E4/P89C557E4 Single-chip 8-bit microcontroller 1999 Mar 02 67 tCLKL Figure 57. External Clock Drive waveform VIH1 VIH1 0.8V tCLK VIH1 VIH1 0.8V tCLKH tCLKR tCLKF 2.4 V 0.45 V 2.0 V 0.8 V NOTE: Figure 58. AC Testing Input/Output 2.4 V NOTE: Figure 59. AC Testing, Float Waveform AC inputs during testing are driven at 2.4V for a logic ‘HIGH’ and 0.45V for a logic ‘LOW’. Timing measurements are made at 2.0 V for a logic ‘HIGH’ and 0.8 V for a logic ‘LOW’. 2.4 V 0.45 V 0.45 V Float 2.0 V 0.8 V 2.0 V 0.8 V Test Points 2.0 V 0.8 V sources 400 mA at the voltage test levels. The float state is defined as the point at which a port 0 pins sinks 3.2 mA or tPXIZ Figure 60. External Program Memory Read Cycle ALE PSEN PORT 0 PORT 2 A8–A15 A8–A15 A0–A7 A0–A7 tAVLL tPXIX tLLAX INSTR IN tPLIV tLHLL tPLPH tLLIV tPLAZ tLLPL tAVIV |
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