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DAC6571 Datasheet(PDF) 2 Page - Texas Instruments

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Part No. DAC6571
Description  2.7 V to 5.5 V, I2C INTERFACE, VOLTAGE OUTPUT, 10-BIT DIGITAL-TO-ANALOG CONVERTER
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

DAC6571 Datasheet(HTML) 2 Page - Texas Instruments

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PIN CONFIGURATIONS
A0
SCL
SDA
6
5
4
1
2
3
VOUT
GND
VDD
1
2
3
6
5
4
(TOP VIEW)
(BOTTOM VIEW)
Lot Trace Code
ABSOLUTE MAXIMUM RATINGS
(1)
DAC6571
SLAS406 – DECEMBER 2003
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated
circuits be handled with appropriate precautions. Failure to observe proper handling and installation
procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision
integrated circuits may be more susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION
SPECIFIED
PACKAGE
PACKAGE
ORDERING
PRODUCT
PACKAGE
TEMPERATURE
TRANSPORT MEDIA
DESIGNATOR
MARKING
NUMBER
RANGE
DAC6571IDBVT
250 Piece Small Tape and Reel
DAC6571
SOT23-6
DBV
-40
°C to +105°C
D671
DAC6571IDBVR
3000 Piece Tape and Reel
PIN DESCRIPTION (SOT23-6)
PIN
NAME
DESCRIPTION
1
VOUT
Analog output voltage from DAC
Ground reference point for all
2
GND
circuitry on the part
3
VDD
Analog Voltage Supply Input
4
SDA
Serial Data Input
5
SCL
Serial Clock Input
6
A0
Device Address Select
LOT
Year (3 = 2003); M onth (1–9 = JAN–SEP; A=OCT,
TRACE
B=NOV, C=DEC); LL– Random code generated
CODE:
when assembly is requested
UNITS
VDD to GND
-0.3V to +6V
Digital Input voltage to GND
-0.3 V to +VDD + 0.3 V
VOUT to GND
-0.3 V to +VDD + 0.3 V
Operating temperature range
-40
°C to + 105°C
Storage temperature range
-65
°C to + 150°C
Junction temperature range (TJ max)
+ 150
°C
Power dissipation
(TJmax - TA)RΘJA
Thermal impedance, RΘJA
240
°C/W
Lead temperature, soldering
Vapor phase (60s)
215
°C
Infrared (15s)
220
°C
(1)
Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2


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