CY7C245A
Document #: 38-04007 Rev. *D
Page 4 of 12
Maximum Ratings[2]
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature
..................................... −65°C to +150°C
Ambient Temperature with
Power Applied
.................................................. −55°C to +125°C
Supply Voltage to Ground Potential
(Pin 24 to Pin 12)
.................................................−0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State
.....................................................−0.5V to +7.0V
DC Input Voltage
.................................................−3.0V to +7.0V
DC Program Voltage (Pins 7, 18, 20) ........................... 13.0V
UV Erasure ................................................... 7258 Wsec/cm2
Static Discharge Voltage........................................... > 2001V
(per MIL-STD-883, Method 3015)
Latch-up Current..................................................... > 200 mA
Operating Range
Range
Ambient Temperature
VCC
Commercial
0°C to +70°C
5V
±10%
Military[3]
−55°C to +125°C
5V
±10%
Industrial
–40°C to +85°C
5V ±10%
Electrical Characteristics Over the Operating Range[4,5]
Parameter
Description
Test Conditions
7C245A-15
7C245A-18
7C245A-25
7C245A-35
7C245A-45
Unit
Min.
Max.
Min. Max. Min.
Max.
VOH
Output HIGH Voltage
VCC = Min., IOH = −4.0 mA
VIN = VIH or VIL
2.4
2.4
2.4
V
VOL
Output LOW Voltage
VCC = Min., IOL = 16 mA
VIN = VIH or VIL
0.4
0.4
0.4
V
VIH
Input HIGH Level
Guaranteed Input Logical
HIGH Voltage for All Inputs
2.0
VCC
2.0
VCC
2.0
VCC
V
VIL
Input LOW Level
Guaranteed Input Logical
LOW Voltage for All Inputs
0.8
0.8
0.8
V
IIX
Input Leakage Current
GND < VIN < VCC
−10
+10
−10
+10
−10
+10
µA
VCD
Input Clamp Diode Voltage
Note 5
IOZ
Output Leakage Current
GND < VO < VCC Output
Disabled[6]
−10
+10
−10
+10
−10
+10
µA
IOS
Output Short Circuit Current
VCC = Max., VOUT = 0.0V
[7]
−20
−90
−20
−90
−20
−90
mA
ICC
Power Supply Current
VCC = Max.,
IOUT = 0 mA
Com’l
120
120
90
mA
Mil
120
120
VPP
Programming Supply Voltage
12
13
12
13
12
13
V
IPP
Programming Supply Current
50
50
50
mA
VIHP
Input HIGH Programming Voltage
3.0
3.0
3.0
V
VILP
Input LOW Programming Voltage
0.4
0.4
0.4
V
Capacitance[5]
Parameter
Description
Test Conditions
Max.
Unit
CIN
Input Capacitance
TA = 25°C, f = 1 MHz,
VCC = 5.0V
10
pF
COUT
Output Capacitance
10
pF
Notes:
2. The voltage on any input or I/O pin cannot exceed the power pin during power-up.
3. TA is the “instant on” case temperature.
4. See page 3 of this data sheet for Group A subgroup testing information.
5. See the “Introduction to CMOS PROMs” section of the Cypress Data Book for general information on testing.
6. For devices using the synchronous enable, the device must be clocked after applying these voltages to perform this measurement.
7. For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.
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