Y

B

A

1

2

3

4

5

6

7

14

13

12

11

10

9

8

1A

1B

1Y

2A

2B

2Y

GND

4B

4A

4Y

3B

3A

3Y

J OR W PACKAGE

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SN54AC00-SP

SCHS367B – OCTOBER 2008 – REVISED FEBRUARY 2015

SN54AC00-SP Radiation Hardened Quad 2 Input NAND Gate

1 Features

3 Description

The SN54AC00 device contains four independent 2-

1

•

5962R87549:

input NAND gates. Each gate performs the Boolean

–

Radiation Hardness Assurance (RHA) up to

function of Y = A • B or Y = A + B in positive logic.

TID 100 krad (Si)

–

SEL/SEU Immune to 86 MeV

Device Information(1)

PART NUMBER

PACKAGE

BODY SIZE (NOM)

•

5962-87549:

CDIP (14)

5.97 mm × 9.21 mm

–

Total Ionizing Dose 50 krad (Si)

SN54AC00-SP

CFP (14)

6.67 mm × 19.56 mm

•

KGD (0)

Not applicable

•

Inputs Accept Voltages to 6 V

(1) For all available packages, see the orderable addendum at

•

the end of the data sheet.

SPACER

2 Applications

•

Satellite Payloads

•

Satellite Power on Reset Logic

•

RHA Known Good Die (KGD) Offering for Space

Hybrids

Pin Functions (Each Gate)

INPUTS

OUTPUT

Y

A

B

H

H

L

L

X

H

Logic Diagram (Positive Logic)

1

An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,

intellectual property matters and other important disclaimers. PRODUCTION DATA.

On products compliant to MIL-PRF-38535, all parameters are

tested unless otherwise noted. On all other products, production

processing does not necessarily include testing of all parameters.