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An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,

intellectual property matters and other important disclaimers. PRODUCTION DATA.

OPA657-DIE

SBOS787 – AUGUST 2016

OPA657-DIE 1.6-GHz, Low-Noise, FET-Input Operational Amplifier

1

1 Features

1

•

High Gain Bandwidth Product: 1.6 GHz

•

High Bandwidth 275 MHz (G = 10)

•

Slew Rate 700 V/µs (G = 10, 1-V Step)

•

Low-Input Offset Voltage: ±250 µV

•

Low-Input Bias Current: 2 pA

•

Low-Input Voltage Noise: 4.8 nV/

√Hz

•

High-Output Current: 70 mA

•

Fast Overdrive Recovery

2 Applications

•

Wideband Photodiode Amplifiers

•

Wafer Scanning Equipment

•

ADC Input Amplifiers

•

Test and Measurement Front Ends

•

High Gain Precision Amplifiers

•

Optical Time Domain Reflectometry (OTDR)

3 Description

The OPA657 device combines a high gain-bandwidth,

low-distortion, voltage-feedback operational amplifier

with a low voltage noise JFET-input stage to offer a

very high dynamic range amplifier for high-precision

analog-to-digital converter (ADC) driving or wideband

transimpedance applications. Photodiode applications

achieve improved noise and bandwidth using this

decompensated, high gain-bandwidth amplifier.

Very low level signals can be significantly amplified in

a

single

OPA657

gain

stage

with

exceptional

bandwidth and accuracy. The very low input bias

current and capacitance supports this performance

even

for

relatively

high

source

impedance.

Broadband photodetector applications benefit from

the low voltage noise JFET inputs for the OPA657.

The JFET input contributes virtually no current noise,

which

makes

the

device

ideal

for

high-gain

photodiode applications.

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

(2)

Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality

Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room

temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not

warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.

PRODUCT

PACKAGE

DESIGNATOR

PACKAGE

ORDERABLE PART NUMBER

PACKAGE QUANTITY

OPA657

TD

OPA657TD1

324

OPA657TD2

10