Electronic Components Datasheet Search |
|
OPA657TD1 Datasheet(PDF) 1 Page - Texas Instruments |
|
|
OPA657TD1 Datasheet(HTML) 1 Page - Texas Instruments |
1 / 5 page Product Folder Sample & Buy Technical Documents Tools & Software Support & Community An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. OPA657-DIE SBOS787 – AUGUST 2016 OPA657-DIE 1.6-GHz, Low-Noise, FET-Input Operational Amplifier 1 1 Features 1 • High Gain Bandwidth Product: 1.6 GHz • High Bandwidth 275 MHz (G = 10) • Slew Rate 700 V/µs (G = 10, 1-V Step) • Low-Input Offset Voltage: ±250 µV • Low-Input Bias Current: 2 pA • Low-Input Voltage Noise: 4.8 nV/ √Hz • High-Output Current: 70 mA • Fast Overdrive Recovery 2 Applications • Wideband Photodiode Amplifiers • Wafer Scanning Equipment • ADC Input Amplifiers • Test and Measurement Front Ends • High Gain Precision Amplifiers • Optical Time Domain Reflectometry (OTDR) 3 Description The OPA657 device combines a high gain-bandwidth, low-distortion, voltage-feedback operational amplifier with a low voltage noise JFET-input stage to offer a very high dynamic range amplifier for high-precision analog-to-digital converter (ADC) driving or wideband transimpedance applications. Photodiode applications achieve improved noise and bandwidth using this decompensated, high gain-bandwidth amplifier. Very low level signals can be significantly amplified in a single OPA657 gain stage with exceptional bandwidth and accuracy. The very low input bias current and capacitance supports this performance even for relatively high source impedance. Broadband photodetector applications benefit from the low voltage noise JFET inputs for the OPA657. The JFET input contributes virtually no current noise, which makes the device ideal for high-gain photodiode applications. (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. (2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum. Ordering Information(1) PRODUCT PACKAGE DESIGNATOR PACKAGE ORDERABLE PART NUMBER PACKAGE QUANTITY OPA657 TD Bare Die in Gel Pak VR(2) OPA657TD1 324 OPA657TD2 10 |
Similar Part No. - OPA657TD1 |
|
Similar Description - OPA657TD1 |
|
|
Link URL |
Privacy Policy |
ALLDATASHEET.COM |
Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Datasheet Upload | Contact us | Privacy Policy | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |