A1365LKTTN-1-T datasheet(23/32 Pages) ALLEGRO | Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC

23 / 32 page

Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC

With High-Bandwidth (120 kHz) Analog Output and Integrated Fault Comparator

A1365

Allegro MicroSystems, LLC

115 Northeast Cutoff

Worcester, Massachusetts 01615-0036 U.S.A.

1.508.853.5000; www.allegromicro.com

A Fault Overstep is defined as the amount by which the output

voltage exceeds the delta between VOUT(Q) and the DC Fault

Switchpoint (VFPSP and VFNSP). The larger the overstep caused

by an input magnetic field is, the faster tTFR will be. When VFPSP

and VFNSP are programmed near their limits, the maximum Fault

Overstep will be limited because VOUT will be reaching satura-

tion levels (see Figure 19).

Faults can be latched by setting the FAULT_LATCH bit high.

After a fault occurs, the ¯F¯¯A¯¯U¯¯L¯¯T¯ pin will be held low. To reset the

¯F¯¯A¯¯U¯¯L¯¯T¯ pin, the A1365 must be powered down.

Over Magnetic Field Fault can be disabled by setting the

FLT_DIS bit.

Figure 19: Transient Fault Response Time versus Fault Overstep Voltage at VCC = 5 V, CF = 0 F, RL = Open.

0.75

5.5

Overstep (%)

Fault

Worst Process Corner

when V= 0.1 × V

FNSP

Worst Process Corner

when V= 0.9 × V

FPSP

Typical Process Corner

when V> 0.2 × V

FNSP

FPSP

and V< 0.8 × V

Worst Process Corner

when V> 0.17 × V

FNSP

FPSP

and V< 0.87 × V

A1365LKTTN-1-T Datasheet(PDF) 23 Page - Allegro MicroSystems