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A1365LKTTN-1-T Datasheet(PDF) 1 Page - Allegro MicroSystems |
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A1365LKTTN-1-T Datasheet(HTML) 1 Page - Allegro MicroSystems |
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1 / 32 page 
V+ EEPROM and Control Logic VCC (Programming) GND VOUT (Programming) Signal Recovery 6-Bit Programmable Window Comparator Internal Pull-Up 6 bits 0.88 × Vto 0.72 × V CC CC 0.12 × Vto 0.28 × V CC CC V(High) REF COMP_IN V(Low) REF Temperature Sensor Offset Control Sensitivity Control Programming Control + – + – FAULT CBYPASS The A1365 linear output Hall-effect sensor IC is specifically designed to provide a highly accurate output with improved resolution at high bandwidth for use in current-sensing applications. This device employs a segmented, linearly interpolated temperature compensation technology, which provides greater accuracy in sensitivity and offset voltage trimming and hence virtually zero temperature drift. This improvementgreatlyreducesthetotalerrorofthedeviceacross the operating temperature range. The highly programmable Over Field Fault signal (FAULT pin) can be used to detect a high magnetic field condition. Broken ground wire detection, undervoltage lockout for VCC below specification, and user-selectable output voltage clamps are also included, which are important for high reliability in automotive applications. The sensor accuracy and diagnostic capability make it ideally suited for automotive sockets such as HEV inverter and DC-to-DC converter applications. The A1365 Hall-effect sensor IC is extremely sensitive, fast, and temperature-stable. The accuracy and flexibility of this device is enhanced by user programmability, performed via the VCC supply and the output pins, which allows the device to be optimized in the application. ThisratiometricHall-effectsensorICprovidesavoltageoutput thatis proportionalto the appliedmagneticfield.The quiescent output voltage is user-adjustable around 50% (bidirectional) of A1365-GS-DS • Proprietary segmented linear temperature compensation (TC) technology provides a typical accuracy of 1% over the full operating temperature range • 120 kHz nominal bandwidth achieved via proprietary packaging and chopper stabilization techniques • Over Field Fault signal with 6-bit programmable trigger levels, 2-bit programmable hysteresis, and latching or non-latching behavior • Over Field Fault response time < 4.5 μs (typ) • Extremely low noise and high resolution achieved via proprietary Hall element and low-noise amplifier circuits • Customer-programmable, high-resolution offset and sensitivity trim • Available in a 1-mm-thick SIP through-hole package • Factory-programmed sensitivity and quiescent output voltage TC with extremely stable temperature performance Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC With High-Bandwidth (120 kHz) Analog Output and Integrated Fault Comparator Functional Block Diagram A1365 Continued on the next page… Continued on the next page… PACKAGE: 4-Pin SIP (suffix KT) Not to scale FEATURES AND BENEFITS DESCRIPTION |
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