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A1365LKTTN-1-T Datasheet(PDF) 8 Page - Allegro MicroSystems

Part No. A1365LKTTN-1-T
Description  Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
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Maker  ALLEGRO [Allegro MicroSystems]
Homepage  http://www.allegromicro.com
Logo ALLEGRO - Allegro MicroSystems

A1365LKTTN-1-T Datasheet(HTML) 8 Page - Allegro MicroSystems

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Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC
With High-Bandwidth (120 kHz) Analog Output and Integrated Fault Comparator
A1365
8
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
Characteristic
Symbol
Test Conditions
Min.
Typ.
Max.
Unit1
Factory-Programmed Quiescent Voltage Output Temperature Coefficient
Quiescent Voltage Output
Temperature Coefficient2
TCQVO
TA = 150°C, TA = –40°C, calculated relative
to 25°C
0
mV/°C
Quiescent Voltage Output Drift
Through Temperature Range2,12,18
ΔVOUT(Q)TC
SENS_COARSE = 00, SENS_COARSE = 01,
or SENS_COARSE = 10, TA = 25°C to 150°C
–10
10
mV
SENS_COARSE = 11, TA = 25°C to 150°C
–15
15
mV
TA = –40°C to 25°C
–30
30
mV
Average Quiescent Voltage
Output Temperature Compensation
Step Size
StepQVOTC
2.3
mV
Lock Bit Programming
EEPROM Lock Bit
EELOCK
1
bit
Error Components
Linearity Sensitivity Error2,19
LinERR
–1
< ±0.25
1
%
Symmetry Sensitivity Error2
SymERR
–0.5
< ±0.25
0.5
%
Ratiometry Quiescent Voltage Output
Error2,20
RatERRVOUT(Q) Relative to VCC = 5 V ±5%
–0.3
0
0.3
%
Ratiometry Sensitivity Error2,20
RatERRSens Relative to VCC = 5 V ±5%
–1
< ±0.5
1
%
Ratiometry Clamp Error2,21
RatERRCLP TA = 25ºC, Relative to VCC = 5 V ±5%
< ±1
%
Sensitivity Drift Due to Package
Hysteresis2
ΔSensPKG
TA = 25°C, after temperature cycling, 25°C to
150°C and back to 25°C
-1.25
±1.25
%
Sensitivity Drift Over Lifetime22
ΔSensLIFE
TA = 25°C, shift after AEC Q100 grade 0
qualification testing
±1%
%
1
1 G (gauss) = 0.1 mT (millitesla).
2
See Characteristic Definitions section.
3
fC varies up to approximately ±5% over the full operating ambient temperature range, TA.
4
If the programmed Fault Switchpoint exceeds the clamp voltage, Fault operation will have priority over clamp operation.
5
Sens, VOUT(Q), VCLP(LOW), and VCLP(HIGH) scale with VCC due to ratiometry.
6
Noise, measured in mVPP and in mVRMS, is dependent on the sensitivity of the device.
7
Output stability is maintained for capacitive loads as large as 10 nF.
8
High-to-low transition of output voltage is a function of external load components and device sensitivity.
9
Fault Switchpoint and Fault Hysteresis are ratiometric.
10
Refer to Fault Characteristics section for the impact of load circuit and different Fault switchpoint settings on Transient Fault
Response Time.
11
Raw device characteristic values before any programming.
12
Exceeding the specified ranges will cause sensitivity and Quiescent Voltage Output drift through the temperature range to deteriorate beyond the specified values.
13
Refer to Functional Description section.
14
Step size is larger than required, in order to provide for manufacturing spread. See Characteristic Definitions section.
15
Non-ideal behavior in the programming DAC can cause the step size at each significant bit rollover code to be greater than twice the maximum specified value of
StepVOUT(Q) or StepSENS.
16
Overall programming value accuracy. See Characteristic Definitions section.
17
Each A1365 part number is factory-programmed and temperature compensated at a different coarse sensitivity setting. Changing coarse bits setting could cause sensitiv-
ity drift through temperature range ,ΔSensTC, to exceed specified limits.
18
Allegro will be testing and temperature compensating each device at 150°C. Allegro will not be testing devices at –40°C. Temperature compensation codes will be applied
based on characterization data.
19
Linearity applies to output voltage ranges of ±2 V from the quiescent output for bidirectional devices.
20
Percent change from actual value at VCC = 5 V, for a given temperature, through the supply voltage operating range.
21
Percent change from actual value at VCC = 5 V, TA = 25°C, through the supply voltage operating range.
22
Based on characterization data obtained during standardized stress test for Qualification of Integrated Circuits. Cannot be guaranteed. Drift is a function of customer ap-
plication conditions. Contact Allegro MicroSystems for further information.
23
Includes sensitivity drift due to package hysteresis after exposing the sensor to a temperature of 150ºC for 60 seconds during test.
OPERATING CHARACTERISTICS (continued): valid through the full operating temperature range, TA, CBYPASS = 0.1 µF,
and VCC = 5 V, unless otherwise specified


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