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K9F1G08U0A Datasheet(PDF) 11 Page - Samsung semiconductor |
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K9F1G08U0A Datasheet(HTML) 11 Page - Samsung semiconductor |
11 / 37 page FLASH MEMORY 11 K9F1G08U0A K9F1G08Q0A Program / Erase Characteristics NOTE : 1. Max. time of tCBSY depends on timing between internal program completion and data in Parameter Symbol Min Typ Max Unit Program Time tPROG - 300 700 µs Dummy Busy Time for Cache Program tCBSY 3 700 µs Number of Partial Program Cycles in the Same Page Main Array Nop - - 4 cycles Spare Array - - 4 cycles Block Erase Time tBERS - 2 3 ms AC Timing Characteristics for Command / Address / Data Input NOTE : 1. tADL is the time from the WE rising edge of final address cycle to the WE rising edge of first data cycle. Parameter Symbol Min Max Unit K9F1G08Q0A K9F1G08U0A K9F1G08Q0A K9F1G08U0A CLE setup Time tCLS 25 10 - - ns CLE Hold Time tCLH 10 5 - - ns CE setup Time tCS 35 15 - - ns CE Hold Time tCH 10 5 - - ns WE Pulse Width tWP 25 15 - - ns ALE setup Time tALS 25 10 - - ns ALE Hold Time tALH 10 5 - - ns Data setup Time tDS 20 10 - - ns Data Hold Time tDH 10 5 - - ns Write Cycle Time tWC 45 30 - - ns WE High Hold Time tWH 15 10 - - ns ALE to Data Loading Time tADL 100(1) 100(1) - - ns |
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