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CY7C261
CY7C263/CY7C264
Document #: 38-04010 Rev. *B
Page 3 of 14
Electrical Characteristics Over the Operating Range[3,4]
7C261-20, 25
7C263-20, 25
7C264-20, 25
7C261-35, 45, 55
7C263-35, 45, 55
7C264-35, 45, 55
Parameter
Description
Test Conditions
Min.
Max.
Min.
Max.
Unit
VOH
Output HIGH Voltage
VCC = Min., IOH = –2.0 mA
2.4
V
VOH
Output HIGH Voltage
VCC = Min., IOH = –4.0 mA
2.4
V
VOL
Output LOW Voltage
VCC = Min., IOL = 8 mA
(6 mA Mil)
0.4
V
VOL
Output LOW Voltage
VCC = Min., IOL = 16 mA
0.4
V
VIH
Input HIGH Level
2.0
2.0
V
VIL
Input LOW Level
0.8
0.8
V
IIX
Input Current
GND < VIN < VCC
–10
+10
–10
+10
µA
VCD
Input Diode Clamp Voltage
Note 4
Note 4
IOZ
Output Leakage Current
GND < VOUT < VCC
Output Disabled
Com’l
–10
+10
–10
+10
µA
Mil
–40
+40
–40
+40
µA
IOS
Output Short Circuit Current[5]
VCC = Max., VOUT = GND
–20
–90
–20
–90
mA
ICC
Power Supply Current
VCC = Max., f = Max.
IOUT = 0 mA
Com’l
120
100
mA
Mil
140
120
ISB
Standby Supply Current (7C261)
VCC = Max.,
CS > VIH
Com’l
40
30
mA
Mil
40
30
VPP
Programming Supply Voltage
12
13
12
13
V
IPP
Programming Supply Current
50
50
mA
VIHP
Input HIGH Programming Voltage
4.75
4.75
V
VILP
Input LOW Programming Voltage
0.4
0.4
V
Capacitance[4]
Parameter
Description
Test Conditions
Max.
Unit
CIN
Input Capacitance
TA = 25°C, f = 1 MHz,
VCC = 5.0V
10
pF
COUT
Output Capacitance
10
pF
Notes:
3.
See the last page of this specification for Group A subgroup testing information.
4.
See the “Introduction to CMOS PROMs” section of the Cypress Data Book for general information on testing.
5.
For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.]