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DS1556 Datasheet(PDF) 16 Page - Dallas Semiconductor |
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DS1556 Datasheet(HTML) 16 Page - Dallas Semiconductor |
16 / 20 page DS1556 1M, Nonvolatile, Y2K-Compliant Timekeeping RAM 16 of 20 AC TEST CONDITIONS Output Load: 50 pF + 1TTL Gate Input Pulse Levels: 0.0 to 3.0V Timing Measurement Reference Levels: Input: 1.5V Output: 1.5V Input Pulse Rise and Fall Times: 5 ns NOTES: 1. Voltage referenced to ground. 2. Typical values are at +25 °C and nominal supplies. 3. Outputs are open. 4. Battery switchover occurs at the lower of either the battery voltage or VPF. 5. The IRQ/FT and RST outputs are open drain. 6. Data-retention time is at +25 °C. 7. Each DS1556 has a built-in switch that disconnects the lithium source until VCC is first applied by the user. The expected tDR is defined for DIP modules and PowerCap modules as a cumulative time in the absence of VCC starting from the time power is first applied by the user. 8. RTC modules (DIP) can be successfully processed through conventional wave-soldering techniques as long as temperature exposure to the lithium energy source contained within does not exceed +85 °C. Post-solder cleaning with water-washing techniques is acceptable, provided that ultrasonic vibration is not used. In addition, for the PowerCap: a. Dallas Semiconductor recommends that PowerCap Module bases experience one pass through solder reflow oriented with the label side up (“live-bug”). b. Hand soldering and touch-up: Do not touch or apply the soldering iron to leads for more than 3 seconds. To solder, apply flux to the pad, heat the lead frame pad and apply solder. To remove the part, apply flux, heat the lead frame pad until the solder reflow and use a solder wick to remove solder. 9. tAH1, tDH1 are measured from WE going high. 10. tAH2, tDH2 are measured from CE going high. |
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