PCM4204

SBAS327A − JUNE 2004 − REVISED SEPTEMBER 2004

www.ti.com

2

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate

precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to

damage because very small parametric changes could cause the device not to meet its published specifications.

ABSOLUTE MAXIMUM RATINGS

over operating free-air temperature range unless otherwise noted(1)

PCM4204

UNIT

Supply voltage

VCC1, VCC2

+6.0

V

Supply voltage

VDD1, VDD2, VDD3

+3.6

V

Ground voltage differences

(any AGND to DGND or BGND)

±0.1

V

Digital input voltage

FMT0, FMT1, FMT2, S/M, FS0, FS1, FS2,

SCKI, RST, HPFD, SUB, BCK, LRCK,

DSDCLK, DSD1, DSD2, DSD3, DSD4, TEST

−0.3 to (VDD + 0.3)

V

Analog input voltage

VIN1−4+, VIN1−4−

−0.3 to (VCC + 0.3)

V

Input current (any pin except supplies)

±10mA

V

Operating temperature range

−10 to +70

°C

Storage temperature range, TSTG

−65 to +150

°C

(1) Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute maximum

conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the device at these or

any other conditions beyond those specified is not implied.

PACKAGE/ORDERING INFORMATION

For the most current package and ordering information, see the Package Option Addendum located at the end of this

datasheet.