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SN75LVDS84 Datasheet(PDF) 8 Page - Texas Instruments |
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SN75LVDS84 Datasheet(HTML) 8 Page - Texas Instruments |
8 / 17 page www.ti.com CLKIN D0,6,12 D1,7,13 D2,8,14 D3,9,15 D18,19,20 AllOthers T0276-01 t c CLKIN EvenDn OddDn T0277-01 SN75LVDS84 SLLS270D – MARCH 1997 – REVISED NOVEMBER 2007 PARAMETER MEASUREMENT INFORMATION (continued) A. The 16-grayscale test-pattern test device power consumption for a typical display pattern. B. VIH = 2 V and VIL = 0.8 V Figure 4. 16-Grayscale Test-Pattern Waveforms A. The worst-case test pattern produces nearly the maximum switching frequency for all of the LVDS outputs. B. VIH = 2 V and VIL = 0.8 V Figure 5. Worst-Case Test-Pattern Waveforms 8 Submit Documentation Feedback Copyright © 1997–2007, Texas Instruments Incorporated Product Folder Link(s) :SN75LVDS84 |
Similar Part No. - SN75LVDS84_08 |
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Similar Description - SN75LVDS84_08 |
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