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LM8364BALMF20 Datasheet(PDF) 1 Page - Texas Instruments |
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LM8364BALMF20 Datasheet(HTML) 1 Page - Texas Instruments |
1 / 14 page INPUT + - VREF RESET GND INPUT GND N/C N/C 1 2 3 5 4 RESET LM8364 www.ti.com SNVS232B – MARCH 2003 – REVISED APRIL 2013 LM8364 Micropower Undervoltage Sensing Circuits Check for Samples: LM8364 1 FEATURES DESCRIPTION The LM8364 series are micropower undervoltage 2 • Extremely Low Quiescent Current: 0.65 μA, at sensing circuits that are ideal for use in battery VIN = 2.87V powered microprocessor based systems, where • High Accuracy Threshold Voltage (±2.5%) extended battery life is a key requirement. • Open Drain Output A range of threshold voltages from 2.0V to 4.5V are • Input Voltage Range: 1V to 6V available with an active low open drain output. These devices feature a very low quiescent current of • Surface Mount Package (5-Pin SOT-23) 0.65µA typical. The LM8364 series features a highly • Pin for Pin Compatible with MC33464 accurate voltage reference, a comparator with precise thresholds and built-in hysterisis to prevent erratic APPLICATIONS reset operation, and ensured Reset operation down • Low Battery Detection to 1.0V with extremely low standby current. • Microprocessor Reset Controller These devices are available in the space saving SOT-23 5-pin surface mount package. For other • Power Fail Indicator undervoltage thresholds and output options, please • Battery Backup Detection contact Texas Instruments. Functional Block Diagram Connection Diagram Figure 1. 5-Pin SOT-23 Top View 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. 2 All trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Copyright © 2003–2013, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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