Specifications ispLSI 2032E

4

+ 5V

R1

R2

Device

Output

Test

Point

0213A

DC Electrical Characteristics

Output Load Conditions (see Figure 2)

TEST CONDITION

R1

R2

CL

A

470Ω

390Ω

35pF

B

∞

390Ω

35pF

470Ω

390Ω

35pF

Active High

Active Low

C

470Ω

390Ω

5pF

∞

390Ω

5pF

Active Low to Z

at V +0.5V

OL

Active High to Z

at V

-0.5V

OH

Table 2 - 0004A

Input Pulse Levels

Table 2-0003/2032E

Input Rise and Fall Time 10% to 90%

Input Timing Reference Levels

Output Timing Reference Levels

Output Load

GND to 3.0V

1.5V

1.5V

See Figure 2

3-state levels are measured 0.5V from

steady-state active level.

1.5 ns

Figure 2. Test Load

SYMBOL

2. Meaured using two 16-bit counters.

4. Unused inputs held at 0.0V.

5. Available in 48-pin package only.

Power Consumption section of this data sheet and the Thermal Management section of the Lattice Semiconductor

Table 2-0007/2032E

PARAMETER

Output Low Voltage

Output High Voltage

Input or I/O Low Leakage Current

I/O Active Pull-Up Current, non-PCI

Output Short Circuit Current, non-PCI

Operating Power Supply Current

CONDITION

MIN.

TYP.

3

MAX. UNITS

–

2.4

–

–

–

-10

–

–

–

–

–

–

–

–

0.4

–

10

-10

10

-150

-200

V

V

µA

Input or I/O High Leakage Current

µA

µA

µA

I/O Active Pull-Up Current, PCI

5

-10

–

-250

µA

mA

Output Short Circuit Current, PCI

5

–

–

-240

mA

–85

mA

–

–65

-225/-200

Others

mA

–

Switching Test Conditions