SN74LVC2G17

SCES381N – JANUARY 2002 – REVISED JANUARY 2015

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7 Specifications

7.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)

(1)

MIN

MAX

UNIT

Supply voltage range

–0.5

6.5

V

–0.5

6.5

V

–0.5

6.5

V

–0.5

V

Input clamp current

–50

mA

Output clamp current

–50

mA

Continuous output current

±50

mA

±100

mA

Junction temperature under bias

150

°C

Storage temperature range

–65

150

°C

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating

Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.

(3)

7.2 ESD Ratings

VALUE

UNIT

2000

V

(1)

Charged-Device Model (CDM), per JEDEC specification JESD22-C101, all

1000

V

(1)

Electrostatic discharge (ESD) to measure device sensitivity and immunity to damage caused by assembly line electrostatic discharges in

to the device.

(2)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(3)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

7.3 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted)

(1)

MIN

MAX

UNIT

Supply voltage

Operating

1.65

5.5

V

Input voltage

0

5.5

V

Output voltage

0

V

–4

–8

High-level output current

–16

mA

–24

–32

4

8

Low-level output current

16

mA

24

32

Operating free-air temperature

–40

125

°C

(1)

Implications of Slow or Floating CMOS Inputs, literature number SCBA004.

4

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