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LM53602-Q1, LM53603-Q1

SNVSA42B – JUNE 2015 – REVISED MAY 2016

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(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended

Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. Values given

are D.C.

(2)

A maximum of 42 V can be sustained at this pin for a duration of

≤ 500 ms at a duty cycle of ≤ 0.01%.

(3)

Transients on this pin, not exceeding –3 V or +40 V, can be tolerated for a duration of

≤ 100 ns. For transients between 40 V and 42 V,

see note (2).

(4)

Positive current flows into this pin.

(5)

A transient voltage of ±2 V can be sustained for

≤1 µs.

7 Specifications

7.1 Absolute Maximum Ratings

over the recommended operating junction temperature range of –40°C to 150°C (unless otherwise noted)

(1)

PARAMETER

MIN

MAX

UNIT

–0.3

40

V

–0.3

V

CBOOT to SW

–0.3

3.6

V

–0.3

40

V

BIAS to AGND, PGND

–0.3

16

V

FB to AGND, PGND : fixed 5 V and 3.3 V

–0.3

16

V

FB to AGND, PGND : ADJ

–0.3

5.5

V

RESET to AGND, PGND

–0.3

8

V

SYNC, FPWM, to AGND, PGND

–0.3

5.5

V

VCC to AGND, PGND

–0.3

4.2

V

–0.1

1.2

mA

–0.3

0.3

V

–40

150

°C

(1)

AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.

7.2 ESD Ratings

VALUE

UNIT

VIN, SW, CBOOT

±1500

V

EN, BIAS, RESET, FB,

SYNC, PWM, VCC

±2500

Charged-device model (CDM), per AEC Q100-011

CBOOT, VCC, BIAS, SYNC,

FPWM, EN, VIN

±750

SW, RESET, FB, PGND

±500