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LM4050WG2.5RLQV Datasheet(PDF) 10 Page - Texas Instruments |
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LM4050WG2.5RLQV Datasheet(HTML) 10 Page - Texas Instruments |
10 / 18 page LM4050QML SNVS627G – JUNE 2010 – REVISED JULY 2013 www.ti.com Functional Block Diagram APPLICATIONS INFORMATION The LM4050QML is a precision micro-power curvature-corrected bandgap shunt voltage reference. The LM4050QML is available in the 10-Lead Ceramic CLGA package. The LM4050QML has been designed for stable operation without the need of an external capacitor connected between the “+” pin and the “ −” pin. If, however, a bypass capacitor is used, the LM4050QML remains stable. The LM4050-2.5QML has a 60 μA minimum and 15 mA maximum operating current. The LM4050-5.0QML has a 74 μA minimum and 15 mA maximum operating current. The typical thermal hysteresis specification is defined as the change in +25°C voltage measured after thermal cycling. The device is thermal cycled to temperature -55°C and then measured at 25°C. Next the device is thermal cycled to temperature +125°C and again measured at 25°C. The resulting VOUT delta shift between the 25°C measurements is thermal hysteresis. Thermal hysteresis is common in precision references and is induced by thermal-mechanical package stress. Changes in environmental storage temperature, operating temperature and board mounting temperature are all factors that can contribute to thermal hysteresis. In a conventional shunt regulator application (Figure 12) , an external series resistor (RS) is connected between the supply voltage and the LM4050QML. RS determines the current that flows through the load (IL) and the LM4050QML (IQ). Since load current and supply voltage may vary, RS should be small enough to supply at least the maximum ensured IRMIN (spec. table) to the LM4050QML even when the supply voltage is at its minimum and the load current is at its maximum value. When the supply voltage is at its maximum and IL is at its minimum, RS should be large enough so that the current flowing through the LM4050QML is less than 15 mA. RS is determined by the supply voltage, (VS), the load and operating current, (IL and IQ), and the LM4050QML's reverse breakdown voltage, VR. (1) Radiation Environments Careful consideration should be given to environmental conditions when using a product in a radiation environment. TOTAL IONIZING DOSE Radiation hardness assured (RHA) products are those part numbers with a total ionizing dose (TID) level specified in the Ordering Information table on the front page. Testing and qualification of these products is done on a wafer level according to MIL-STD-883, Test Method 1019. Wafer level TID data is available with lot shipments. Testing and qualification is performed at the 30, 50 and 100 krad TID levels at a dose rate of 10 mrad/s, using a 1.5X overtest at each TID level. For the 30 krad level units are tested to 50 krad, for 50 krad units are tested to 80 krad and for 100 krad units are tested to 150 krad, with all parameters remaining inside the post irradiation test limits. 10 Submit Documentation Feedback Copyright © 2010–2013, Texas Instruments Incorporated Product Folder Links: LM4050QML |
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