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LM3559 Datasheet(PDF) 10 Page - Texas Instruments

Part # LM3559
Description  Synchronous Boost Flash Driver
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
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LM3559 Datasheet(HTML) 10 Page - Texas Instruments

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LM3559
SNVS624B – JUNE 2011 – REVISED JUNE 2016
www.ti.com
Product Folder Links: LM3559
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Copyright © 2011–2016, Texas Instruments Incorporated
Typical Characteristics (continued)
Unless otherwise specified: VIN = 3.6 V, COUT = 10 µF, CIN = 10 µF, L = 1 µH (TOKO FDSD0312-1R0, RL = 43 mΩ),
Figure 43.
Figure 19. VIN Flash Monitor Operation
Figure 20. NTC-Mode Operation
Figure 21. AET-Mode Operation
Figure 22. HWEN Operation Device Enabled in Flash Mode
Figure 23. TX1 Interrupt (Force Torch)
TX2 Active High
Figure 24. TX2 Interrupt (Forced Shutdown)
(1)
The typical curve for current limit is measured in closed loop using Figure 43, and increasing IOUT until the peak
inductor current stops increasing. The value given in Electrical Characteristics is measured open loop and is found by
forcing current into SW until the current limit comparator threshold is reached. Closed loop data appears higher due to
the delay between the comparator trip point and the NFET turning off. This delay allows the closed loop inductor
current to ramp higher after the trip point by approximately 20 ns × VIN/L.
(2)
The typical curve for overvoltage protection (OVP) is measured in closed loop using Figure 43 . The OVP value is
found by forcing an open circuit in the LED1 and LED2 path and recording the peak value of VOUT. The value given in
Electrical Characteristics is found in an open loop configuration by ramping the voltage at OUT until the OVP
comparator trips. The closed loop data can appear higher due to the stored energy in the inductor being dumped into
the output capacitor after the OVP comparator trips. Worst case is an open circuit condition where the output voltage
can continue to rise after the OVP comparator trips by approximately IIN × sqrt(L/COUT).


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