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SN74ABT125DR Datasheet(PDF) 4 Page - Texas Instruments

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Part No. SN74ABT125DR
Description  QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS
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Maker  TI1 [Texas Instruments]
Homepage  http://www.ti.com
Logo TI1 - Texas Instruments

SN74ABT125DR Datasheet(HTML) 4 Page - Texas Instruments

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SN54ABT125, SN74ABT125
QUADRUPLE BUS BUFFER GATES
WITH 3-STATE OUTPUTS
SCBS182I − FEBRUARY 1997 − REVISED NOVEMBER 2002
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
TA = 25°C
SN54ABT125
SN74ABT125
UNIT
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
MIN
MAX
MIN
MAX
UNIT
VIK
VCC = 4.5 V,
II = −18 mA
−1.2
−1.2
−1.2
V
VCC = 4.5 V,
IOH = −3 mA
2.5
2.5
2.5
V
VCC = 5 V,
IOH = −3 mA
3
3
3
V
VOH
V
45V
IOH = −24 mA
2
2
V
VCC = 4.5 V
IOH = −32 mA
2*
2
V
V
45V
IOL = 48 mA
0.55
0.55
V
VOL
VCC = 4.5 V
IOL = 64 mA
0.55*
0.55
V
Vhys
100
mV
II
VCC = 0 to 5.5 V,
VI = VCC or GND
±1
±1
±1
μA
IOZPU
VCC = 0 to 2.1 V, VO = 0.5 V to 2.7 V, OE = X
±50
±50
±50
μA
IOZPD
VCC = 2.1 V to 0, VO = 0.5 V to 2.7 V, OE = X
±50
±50
±50
μA
IOZH
VCC = 2.1 V to 5.5 V,
VO = 2.7 V, OE ≥ 2 V
10
10
10
μA
IOZL
VCC = 2.1 V to 5.5 V,
VO = 0.5 V, OE ≥ 2 V
−10
−10
−10
μA
Ioff
VCC = 0,
VI or VO ≤ 4.5 V
±100
±100
μA
ICEX
VCC = 5.5 V,
VO = 5.5 V
Outputs high
50
50
50
μA
IO‡
VCC = 5.5 V,
VO = 2.5 V
−50
−100
−200§
−50
−200§
−50
−200§
mA
VCC = 5.5 V,
Outputs high
1
250
250
250
μA
ICC
VCC = 5.5 V,
IO = 0,
Outputs low
24
30
30
30
mA
ICC
IO
0,
VI = VCC or GND
Outputs disabled
0.5
250
250
250
μA
Data
VCC = 5.5 V,
One input at 3.4 V,
Outputs enabled
1.5
1.5
1.5
ΔICC¶
Data
inputs
One input at 3.4 V,
Other inputs at
VCC or GND
Outputs disabled
0.05
0.05
0.05
mA
Control
inputs
VCC = 5.5 V, One input at 3.4 V,
Other inputs at VCC or GND
1.5
1.5
1.5
Ci
VI = 2.5 V or 0.5 V
3
pF
Co
VO = 2.5 V or 0.5 V
7
pF
* On products compliant to MIL-PRF-38535, this parameter does not apply.
All typical values are at VCC = 5 V.
Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
§ This limit may vary among suppliers.
This is the increase in supply current for each input that is at the specified TTL voltage level, rather than VCC or GND.


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