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DP8406 Datasheet(PDF) 1 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part No. DP8406
Description  32-Bit Parallel Error Detection and Correction Circuit
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

DP8406 Datasheet(HTML) 1 Page - National Semiconductor (TI)

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TLF9579
May 1991
DP8406 (54F74F632)
32-Bit Parallel Error Detection and Correction Circuit
General Description
The DP8406 device is a 32-bit parallel error detection and
correction circuit (EDAC) in a 52-pin or 68-pin package The
EDAC uses a modified Hamming code to generate a 7-bit
check word from a 32-bit data word This check word is
stored along with the data word during the memory write
cycle During the memory read cycle the 39-bit words from
memory are processed by the EDAC to determine if errors
have occurred in memory
Single-bit errors in the 32-bit data word are flagged and cor-
rected
Single-bit errors in the 7-bit check word are flagged and the
CPU sends the EDAC through the correction cycle even
though the 32-bit data word is not in error The correction
cycle will simply pass along the original 32-bit data word in
this case and produce error syndrome bits to pinpoint the
error-generating location
Dual-bit errors are flagged but not corrected These errors
may occur in any two bits of the 39-bit word from memory
(two errors in the 32-bit data word two errors in the 7-bit
check word or one error in each word) The gross-error
condition of all LOWs or all HIGHs from memory will be
detected Otherwise errors in three or more bits of the
39-bit word are beyond the capabilities of these devices to
detect
Read-modify-write (byte-control) operations can be per-
formed by using output latch enable LEDBO and the indi-
vidual OEB0 through OEB3 byte control pins
Diagnostics are performed on the EDACs by controls and
internal paths that allow the user to read the contents of the
Data Bit and Check Bit input latches These will determine if
the failure occurred in memory or in the EDAC
Features
Y
Detects and corrects single-bit errors
Y
Detects and flags dual-bit errors
Y
Built-in diagnostic capability
Y
Fast write and read cycle processing times
Y
Byte-write capability
Y
Guaranteed 4000V minimum ESD protection
Y
Fully
pin
and
function
compatible
with
TI’s
SN74ALS632A thru SN74ALS635 series
Simplified Functional Block
TLF9579 – 9
Device
Package
Byte-Write
Output
DP8406
52-Pin
yes
TRI-STATE
DP8406
68-Pin
yes
TRI-STATE
FAST
and TRI-STATE
are registered trademarks of National Semiconductor Corporation
C1995 National Semiconductor Corporation
RRD-B30M105Printed in U S A


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