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5962-9078001MLA Datasheet(PDF) 2 Page - Texas Instruments |
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5962-9078001MLA Datasheet(HTML) 2 Page - Texas Instruments |
2 / 11 page SN54AS821A, SN74AS821A 10-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS SDAS230A – DECEMBER 1983 – REVISED AUGUST 1995 2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 logic symbol† 6Q 18 7Q 17 8Q 16 9Q 15 10Q 14 7 6D 8 7D 9 8D 10 9D EN 1 1Q 23 3 2D 4 3D 5 4D 6 5D 2Q 22 3Q 21 4Q 20 5Q 19 13 CLK OE 11 10D C1 1D 2 1D † This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. Pin numbers shown are for the DW, JT, and NT packages. logic diagram (positive logic) 1D OE 2 1 13 1Q 23 CLK 1D To Nine Other Channels C1 Pin numbers shown are for the DW, JT, and NT packages. absolute maximum ratings over operating free-air temperature range (unless otherwise noted)‡ Supply voltage, VCC 7 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Input voltage, VI 7 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Voltage applied to a disabled 3-state output 5.5 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Operating free-air temperature range, TA: SN54AS821A – 55 °C to 125°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . SN74AS821A 0 °C to 70°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Storage temperature range – 65 °C to 150°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ‡ Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. |
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