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AN78LXX Datasheet(PDF) 6 Page - Panasonic Semiconductor |
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AN78LXX Datasheet(HTML) 6 Page - Panasonic Semiconductor |
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AN78Lxx/AN78LxxM Series 6 SFF00005CEB I Electrical Characteristics at Ta = 25°C (continued) • AN78L12, AN78L12M (12V type) • AN78L15, AN78L15M (15V type) VO 12.5 V 12 Tj = 25°C VO V VI = 14.5 to 27V, IO = 1 to 70mA REGIN 250 mV 120 VI = 14.5 to 27V, Tj = 25°C mV REGL mV 20 IO = 1 to 100mA, Tj = 25°C mV IO = 1 to 40mA, Tj = 25°C VI = 15 to 27V, Tj = 25°C mA 2 Tj = 25°C Note 1) The specified condition Tj = 25°C means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. Note 2) Unless otherwise specified, VI = 19V, IO = 40mA, CI = 0.33µF, CO = 0.1µF, Tj = 0 to 125°C (AN78L12) and Tj = 0 to 100°C (AN78L12M) 100 IBias mA VI = 15 to 27V, Tj = 25°C mA 80 IO = 1 to 40mA, Tj = 25°C Vno dB f = 10Hz to 100kHz 1 0.1 200 12.6 100 50 3.5 40 11.5 11.4 RR VI = 15 to 25V, IO = 40mA, f = 120Hz V 1.7 Tj = 25°C mA 140 mV/ °C −1 Tj = 25°C, VI = 35V 10 50 IO = 5mA, Tj = 0 to 125°C µV ∆IBias(IN) ∆IBias(L) VDIF(min) IO(Short) ∆VO/Ta Output voltage Output voltage tolerance Line regulation Load regulation Bias current Bias current fluctuation to load Output noise voltage Ripple rejection ratio Minimum input/output voltage difference Output short-circuit current Output voltage temperature coefficient Parameter Symbol Conditions Min Typ Max Unit Bias current fluctuation to input VO 15.6 V 15 VO V VI = 17.5 to 30V, IO = 1 to 70mA REGIN 300 mV 130 VI = 17.5 to 30V, Tj = 25°C mV REGL mV 25 IO = 1 to 100mA, Tj = 25°C mV IO = 1 to 40mA, Tj = 25°C VI = 18 to 30V, Tj = 25°C mA 2 Tj = 25°C 110 IBias mA VI = 18 to 30V, Tj = 25°C mA 90 IO = 1 to 40mA, Tj = 25°C Vno dB f = 10Hz to 100kHz 1 0.1 250 15.75 150 75 3.5 38 14.4 14.25 RR VI = 18 to 28V, IO = 40mA, f = 120Hz V 1.7 Tj = 25°C mA 140 −1.3 Tj = 25°C, VI = 35V 12 48 IO = 5mA, Tj = 0 to 125°C Tj = 25°C Note 1) The specified condition Tj = 25°C means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. Note 2) Unless otherwise specified, VI = 23V, IO = 40mA, CI = 0.33µF, CO = 0.1µF, Tj = 0 to 125°C (AN78L15) and Tj = 0 to 100°C (AN78L15M) mV/ °C µV ∆IBias(IN) ∆IBias(L) VDIF(min) IO(Short) ∆VO/Ta Output voltage Output voltage tolerance Line regulation Load regulation Bias current Bias current fluctuation to load Output noise voltage Ripple rejection ratio Minimum input/output voltage difference Output short-circuit current Output voltage temperature coefficient Parameter Symbol Conditions Min Typ Max Unit Bias current fluctuation to input |
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