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DS99R105 Datasheet(PDF) 6 Page - Texas Instruments |
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DS99R105 Datasheet(HTML) 6 Page - Texas Instruments |
6 / 29 page DS99R105, DS99R106 SNLS242D – MARCH 2007 – REVISED APRIL 2013 www.ti.com Serializer Switching Characteristics (continued) Over recommended operating supply and temperature ranges unless otherwise specified. Parameter Test Conditions Min Typ Max Units tHZD DOUT ± HIGH to TRI-STATE Delay RL = 100Ω, 15 ns CL = 10 pF to GND tLZD DOUT ± LOW to TRI-STATE Delay 15 ns (Figure 7)(2) tZHD DOUT ± TRI-STATE to HIGH Delay 200 ns tZLD DOUT ± TRI-STATE to LOW Delay 200 ns tPLD Serializer PLL Lock Time RL = 100Ω, (Figure 8) 10 ms tSD Serializer Delay RL = 100Ω, (Figure 9) 3.5T + 3.5T + ns VODSEL = L, TRFB = H 2.85 10 RL = 100Ω, (Figure 9) 3.5T + 3.5T + ns VODSEL = L, TRFB = L 2.85 10 TxOUT_E_O TxOUT_Eye_Opening 3–40 MHz UI 0.68 (respect to ideal) (Figure 10)(3) (4) (5) (2) When the Serializer output is tri-stated, the Deserializer will lose PLL lock. Resynchronization MUST occur before data transfer. (3) tJIT (@BER of 10e-9) specifies the allowable jitter on TCLK. tJIT not included in TxOUT_E_O parameter. (4) TxOUT_E_O is affected by pre-emphasis value. (5) UI – Unit Interval, equivalent to one ideal serialized data bit width. The UI scales with frequency. Deserializer Switching Characteristics Over recommended operating supply and temperature ranges unless otherwise specified. Parameter Test Conditions Pin/Freq. Min Typ Max Units tRCP Receiver out Clock Period tRCP = tTCP (1) RCLK 25 T 333 ns tRDC RCLK Duty Cycle RCLK 45 50 55 % tCLH LVCMOS Low-to-High CL = 8 pF ROUT [23:0], 2.5 3.5 ns Transition Time (lumped load) LOCK, RCLK (Figure 12) tCHL LVCMOS High-to-Low 2.5 3.5 ns Transition Time tROS ROUT (7:0) Setup Data to RCLK (Figure 16) ROUT [7:0] (0.40)* (29/56)*tRCP ns (Group 1) tRCP tROH ROUT (7:0) Hold Data to RCLK (0.40)* (27/56)*tRCP ns (Group 1) tRCP tROS ROUT (15:8) Setup Data to RCLK (Figure 16) ROUT [15:8], (0.40)* 0.5*tRCP ns (Group 2) LOCK tRCP tROH ROUT (15:8) Hold Data to RCLK (0.40)* 0.5*tRCP ns (Group 2) tRCP tROS ROUT (23:16) Setup Data to (Figure 16) ROUT [23:16] (0.40)* (27/56)*tRCP ns RCLK (Group 3) tRCP tROH ROUT (23:16) Hold Data to RCLK (0.40)* (29/56)*tRCP ns (Group 3) tRCP tHZR HIGH to TRI-STATE Delay (Figure 14) ROUT [23:0], 3 10 ns RCLK, LOCK tLZR LOW to TRI-STATE Delay 3 10 ns tZHR TRI-STATE to HIGH Delay 3 10 ns tZLR TRI-STATE to LOW Delay 3 10 ns tDD Deserializer Delay (Figure 13) RCLK [4+(3/56)]T [4+(3/56)]T ns +5.9 +18.5 tDRDL Deserializer PLL Lock Time from (Figure 15) 3 MHz 5 50 ms Powerdown (2) (1) 40 MHz 5 50 ms RxIN_TOL_L Receiver INput TOLerance Left (Figure 17) (3) (1) (4) 3 MHz–40 MHz 0.25 UI RxIN_TOL_R Receiver INput TOLerance Right (Figure 17) (3) (1) (4) 3 MHz–40 MHz 0.25 UI (1) Specification is ensured by characterization and is not tested in production. (2) The Deserializer PLL lock time (tDRDL) may vary depending on input data patterns and the number of transitions within the pattern. (3) RxIN_TOL is a measure of how much phase noise (jitter) the deserializer can tolerate in the incoming data stream before bit errors occur. It is a measurement in reference with the ideal bit position, please see TI’s AN-1217 (SNLA053) for detail. (4) UI – Unit Interval, equivalent to one ideal serialized data bit width. The UI scales with frequency. 6 Submit Documentation Feedback Copyright © 2007–2013, Texas Instruments Incorporated Product Folder Links: DS99R105 DS99R106 |
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