DS90UR908Q

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SNLS317H – SEPTEMBER 2009 – REVISED APRIL 2013

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

Absolute Maximum Ratings

(1) (2) (3)

−0.3V to +2.5V

−0.3V to +4.0V

−0.3V to +4.0V

LVCMOS I/O Voltage

−0.3V to +(VDDIO + 0.3V)

Receiver Input Voltage

−0.3V to (VDD + 0.3V)

LVDS Output Voltage

−0.3V to (VDDTX + 0.3V)

Junction Temperature

+150°C

Storage Temperature

−65°C to +150°C

48L WQFN Package

Maximum Power Dissipation Capacity at 25°C

Derate about 25°C

1/

27.7 °C/W

3.0 °C/W

≥±15 kV

≥±8 kV

≥±15 kV

≥±8 kV

ESD Rating (HBM)

≥±8 kV

ESD Rating (HBM)

≥±8 kV

ESD Rating (CDM)

≥±1.25 kV

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur, including inoperability and degradation of

device reliability and/or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or

other conditions beyond those indicated in the Recommended Operating Conditions is not implied. The Recommended Operating

Conditions indicate conditions at which the device is functional and the device should not be operated beyond such conditions.

(2)

For soldering specifications see product folder at www.ti.com and SNOA549

(3)

If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and

specifications.

Recommended Operating Conditions

Min

Nom

Max

Units

1.71

1.8

1.89

V

1.71

1.8

1.89

V

3.0

3.3

3.6

V

−40

+25

+105

°C

TxCLKOUT Frequency

5

65

MHz

100

(1)

cable shows no error when the noise frequency on the Ser is less than 750 kHz. The Des on the other hand shows no error when the

noise frequency is less than 400 kHz.

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