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DS90UH925ATRHSJQ1 Datasheet(PDF) 6 Page - Texas Instruments |
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DS90UH925ATRHSJQ1 Datasheet(HTML) 6 Page - Texas Instruments |
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6 / 56 page  DS90UH925AQ-Q1 SNLS481 – JUNE 2014 www.ti.com 7 Specifications 7.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) PARAMETER MIN MAX UNIT VDD33 Supply Voltage –0.3 +4.0 V VDDIO Supply Voltage –0.3 +4.0 V VDDIO + LVCMOS I/O Voltage –0.3 V 0.3 Serializer Output Voltage –0.3 +2.75 V TJ Junction Temperature +150 °C For soldering specifications: see product folder at www.ti.com and www.ti.com/lit/an/snoa549c/snoa549c.pdf (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 7.2 Handling Ratings MIN MAX UNIT Tstg Storage temperature range 48 Lead WQFN Package -65 +150 °C Human body model (HBM), per AEC Q100-002(1) -8 +8 kV V(ESD) Electrostatic discharge Charged device model (CDM), per AEC Q100-011 -1.25 +1.25 Machine Model -250 +250 V Air Discharge (DOUT+, DOUT-) -15 +15 ESD Rating (IEC 61000-4-2) kV RD = 330Ω, CS = 150pF Contact Discharge (DOUT+, DOUT-) -8 +8 ESD Rating (ISO10605) Air Discharge (DOUT+, DOUT-) -15 +15 RD = 330Ω, CS = 150pF kV Contact Discharge (DOUT+, DOUT-) -8 +8 RD = 2KΩ, CS = 150pF or 330pF (1) AEC Q100-002 indicates HBM stressing is done in accordance with the ANSI/ESDA/JEDEC JS-001 specification. 7.3 Recommended Operating Conditions MIN TYP MAX UNIT Supply Voltage (VDD33) 3.0 3.3 3.6 V LVCMOS Supply Voltage (VDDIO) 3.0 3.3 3.6 V OR LVCMOS Supply Voltage (VDDIO) 1.71 1.8 1.89 V Operating Free Air Temperature (TA) −40 +25 +105 °C PCLK Frequency 5 85 MHz Supply Noise(1) 100 mVP-P (1) Supply noise testing was done with minimum capacitors on the PCB. A sinusoidal signal is AC coupled to the VDD33 and VDDIOsupplies with amplitude = 100 mVp-p measured at the device VDD33 and VDDIO pins. Bit error rate testing of input to the Ser and output of the Des with 10 meter cable shows no error when the noise frequency on the Ser is less than 50 MHz. The Des on the other hand shows no error when the noise frequency is less than 50 MHz. 6 Submit Documentation Feedback Copyright © 2014, Texas Instruments Incorporated Product Folder Links: DS90UH925AQ-Q1 |
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