CY54FCT573T, CY74FCT573T

8-BIT LATCHES

WITH 3-STATE OUTPUTS

SCCS068 – OCTOBER 2001

4

POST OFFICE BOX 655303

electrical characteristics over recommended operating free-air temperature range (unless

otherwise noted)

PARAMETER

TEST CONDITIONS

CY54FCT573T

CY74FCT573T

UNIT

PARAMETER

TEST CONDITIONS

MIN

TYP†

MAX

MIN

TYP†

MAX

UNIT

VIK

VCC = 4.5 V,

IIN = –18 mA

–0.7

–1.2

V

VIK

VCC = 4.75 V,

IIN = –18 mA

–0.7

–1.2

V

VCC = 4.5 V,

IOH = –12 mA

2.4

3.3

VOH

VCC 475 V

IOH = –32 mA

2

V

VCC = 4.75 V

IOH = –15 mA

2.4

3.3

VOL

VCC = 4.5 V,

IOL = 32 mA

0.3

0.55

V

VOL

VCC = 4.75 V,

IOL = 64 mA

0.3

0.55

V

Vhys

All inputs

0.2

0.2

V

II

VCC = 5.5 V,

VIN = VCC

5

µA

II

VCC = 5.25 V,

VIN = VCC

5

µA

IIH

VCC = 5.5 V,

VIN = 2.7 V

±1

µA

IIH

VCC = 5.25 V,

VIN = 2.7 V

±1

µA

IIL

VCC = 5.5 V,

VIN = 0.5 V

±1

µA

IIL

VCC = 5.25 V,

VIN = 0.5 V

±1

µA

IOZH

VCC = 5.5 V,

VOUT = 2.7 V

10

µA

IOZH

VCC = 5.25 V,

VOUT = 2.7 V

10

µA

IOZL

VCC = 5.5 V,

VOUT = 0.5 V

–10

µA

IOZL

VCC = 5.25 V,

VOUT = 0.5 V

–10

µA

IOS‡

VCC = 5.5 V,

VOUT = 0 V

–60

–120

–225

mA

IOS‡

VCC = 5.25 V,

VOUT = 0 V

–60

–120

–225

mA

Ioff

VCC = 0 V,

VOUT = 4.5 V

±1

±1

µA

ICC

VCC = 5.5 V,

VIN ≤ 0.2 V,

VIN ≥ VCC – 0.2 V

0.1

0.2

mA

ICC

VCC = 5.25 V,

VIN ≤ 0.2 V,

VIN ≥ VCC – 0.2 V

0.1

0.2

mA

∆ICC

VCC = 5.5 V, VIN = 3.4 V§, f1 = 0, Outputs open

0.5

2

mA

∆ICC

VCC = 5.25 V, VIN = 3.4 V§, f1 = 0, Outputs open

0.5

2

mA

ICCD¶

VCC = 5.5 V, Outputs open,

One input switching at 50% duty cycle, OE = GND,

VIN ≤ 0.2 V or VIN ≥ VCC – 0.2 V

0.06

0.12

mA/

ICCD¶

VCC = 5.25 V, Outputs open,

One input switching at 50% duty cycle, OE = GND,

VIN ≤ 0.2 V or VIN ≥ VCC – 0.2 V

0.06

0.12

MHz

† Typical values are at VCC = 5 V, TA = 25°C.

‡ Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or

sample-and-hold techniques are preferable to minimize internal chip heating and more accurately reflect operational values. Otherwise, prolonged

shorting of a high output can raise the chip temperature well above normal and cause invalid readings in other parametric tests. In any sequence

of parameter tests, IOS tests should be performed last.

§ Per TTL-driven input (VIN = 3.4 V); all other inputs at VCC or GND

¶ This parameter is derived for use in total power-supply calculations.