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DIT4096 Datasheet(PDF) 2 Page - Texas Instruments |
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DIT4096 Datasheet(HTML) 2 Page - Texas Instruments |
2 / 26 page DIT4096 2 SBOS225A www.ti.com Power-Supply Voltage, VDD .............................................................. +6.5V VIO .............................................................. +6.5V Input Current ................................................................................... ±10mA Digital Input Voltage .......................................................... –0.2V to +5.5V Digital Output Voltage ............................................ –0.2V to (VDD + 0.2V) Power Dissipation .......................................................................... 300mW Operating Temperature Range ........................................ –40 °C to +85°C Storage Temperature ..................................................... –55 °C to +125°C Lead Temperature (soldering, 5s) ................................................. +260 °C Package Temperature (IR re-flow, 10s) ........................................ +235 °C ABSOLUTE MAXIMUM RATINGS(1) ELECTROSTATIC DISCHARGE SENSITIVITY This integrated circuit can be damaged by ESD. Texas Instru- ments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGE/ORDERING INFORMATION SPECIFIED PACKAGE TEMPERATURE PACKAGE ORDERING TRANSPORT PRODUCT PACKAGE-LEAD DESIGNATOR(1) RANGE MARKING NUMBER MEDIA, QUANTITY DIT4096 TSSOP-28 PW –40 °C to +85°C DIT4096IPW DIT4096IPW Rails, 50 "" " " " DIT4096IPWR Tape and Reel, 2000 NOTE: (1) For the most current specifications and package information, refer to our web site at www.ti.com. NOTE: (1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is not implied. |
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