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CD54ACT32 Datasheet(PDF) 1 Page - Texas Instruments |
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CD54ACT32 Datasheet(HTML) 1 Page - Texas Instruments |
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1 / 13 page  CD54ACT32, CD74ACT32 QUADRUPLE 2-INPUT POSITIVE-OR GATES SCHS342 – MARCH 2003 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Inputs Are TTL-Voltage Compatible D Buffered Inputs D Speed of Bipolar F, AS, and S, With Significantly Reduced Power Consumption D Balanced Propagation Delays D ±24-mA Output Drive Current – Fanout to 15 F Devices D SCR-Latchup-Resistant CMOS Process and Circuit Design D Exceeds 2-kV ESD Protection Per MIL-STD-883, Method 3015 description/ordering information The ’ACT32 devices are quadruple 2-input positive-OR gates. These devices perform the Boolean function Y + A • B or Y + A ) B in positive logic. ORDERING INFORMATION TA PACKAGE† ORDERABLE PART NUMBER TOP-SIDE MARKING PDIP – E Tube CD74ACT32E CD74ACT32E 55 °Cto125°C SOIC M Tube CD74ACT32M ACT32M –55 °C to 125°C SOIC – M Tape and reel CD74ACT32M96 ACT32M CDIP – F Tube CD54ACT32F3A CD54ACT32F3A † Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package. FUNCTION TABLE (each gate) INPUTS OUTPUT A B Y H X H X HH L L L logic diagram (positive logic) A B Y Copyright 2003, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. 1 2 3 4 5 6 7 14 13 12 11 10 9 8 1A 1B 1Y 2A 2B 2Y GND VCC 4B 4A 4Y 3B 3A 3Y CD54ACT32 ...F PACKAGE CD74ACT32 ...E OR M PACKAGE (TOP VIEW) On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters. |
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