CC2544

SWRS103D – JUNE 2011 – REVISED MAY 2012

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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

DESCRIPTION

The CC2544 is an optimized system-on-chip (SoC) solution for USB applications with datarates upto 2Mbps built

with low bill-of-material cost. The CC2544 combines the excellent performance of a leading RF transceiver with a

single-cycle 8051 compliant CPU, 32-KB in-system programmable flash memory, up to 2-KB RAM, and many

other powerful features.

The CC2544 is compatible with the CC2541/CC2543/CC2545. It comes in a 5-mm × 5-mm QFN32 package, with

SPI/UART/USB interface. The CC2544 comes complete with reference designs from Texas Instruments.

The devices target wireless consumer and HID applications. The CC2544 is ideal for USB dongle applications.

For block diagram, see Figure 7

ABSOLUTE MAXIMUM RATINGS

(1)

over operating free-air temperature range (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

MAX

UNIT

Supply voltage VBUS

–0.3

5.5

V

Supply voltage VDD

All supply pins must have the same voltage

–0.3

≤3.9

V

Voltage on any digital pin

–0.3

≤3.9

V

Input RF level

10

dBm

Storage temperature range

–40

125

°C

All pins, according to human-body model, JEDEC STD 22,

2

kV

method A114 (HBM)

According to charged-device model, JEDEC STD 22, method

750

V

C101 (CDM)

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating

Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

CAUTION: ESD sensitive device. Precautions should be used when handing the device in order to prevent permanent damage.

RECOMMENDED OPERATING CONDITIONS

PARAMETER

TEST CONDITIONS

MIN

MAX

UNIT

–40

85

°C

Operating supply voltage VBUS

Optional to use this regulator

4

5.45

V

Operating supply voltage VDD

All supply pins must have same voltage

2

3.6

V

2

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