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PEH200OA3150MU2 Datasheet(PDF) 4 Page - Kemet Corporation |
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PEH200OA3150MU2 Datasheet(HTML) 4 Page - Kemet Corporation |
4 / 13 page 4 © KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 (864) 963-6300 • www.kemet.com A4034_PEH200 • 3/30/2016 Screw Terminal Aluminum Electrolytic Capacitors – PEH200 Series, +85°C Shelf Life The capacitance, ESR and impedance of a capacitor will not change significantly after extended storage periods, however the leakage current will very slowly increase. KEMET products are particularly stable and allow a shelf life in excess of three years at 40°C. See sectional specification under each product series for specific data. Re-age (Reforming) Procedure Apply the rated voltage to the capacitor at room temperature for a period of one hour, or until the leakage current has fallen to a steady value below the specified limit. During re-aging a maximum charging current of twice the specified leakage current or 5 mA (whichever is greater) is suggested. Reliability The reliability of a component can be defined as the probability that it will perform satisfactorily under a given set of conditions for a given length of time. In practice, it is impossible to predict with absolute certainty how any individual component will perform; thus, we must utilize probability theory. It is also necessary to clearly define the level of stress involved (e.g. operating voltage, ripple current, temperature and time). Finally, the meaning of satisfactory performance must be defined by specifying a set of conditions which determine the end of life of the component. Reliability as a function of time, R(t), is normally expressed as: R(t)=e-λt where R(t) is the probability that the component will perform satisfactorily for time t, and λ is the failure rate. Failure Rate The failure rate is the number of components failing per unit time. The failure rate of most electronic components follows the characteristic pattern: • Early failures are removed during the manufacturing process. • The operational life is characterized by a constant failure rate. • The wear out period is characterized by a rapidly increasing failure rate. The failures in time (FIT) are given with a 60% confidence level for the various type codes. By convention, FIT is expressed as 1 x 10-9 failures per hour. Failure rate is also expressed as a percentage of failures per 1,000 hours. e.g., 100 FIT = 1 x 10-7 failures per hour = 0.01%/1,000 hours End of Life Definition Catastrophic Failure: short circuit, open circuit or safety vent operation Parametric Failure: • Change in capacitance > ±10% • Leakage current > specified limit • ESR > 2 x initial ESR value |
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