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NCV7356D2G Datasheet(PDF) 8 Page - ON Semiconductor |
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NCV7356D2G Datasheet(HTML) 8 Page - ON Semiconductor |
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8 / 24 page  NCV7356 www.onsemi.com 8 TIMING MEASUREMENT LOAD CONDITIONS Normal and High Voltage Wake−Up Mode High−Speed Mode min load / min tau 3.3 k W / 540 pF Additional 140 W tool resistance to ground in parallel min load / max tau 3.3 k W / 1.2 nF max load / min tau 200 W / 5.0 nF Additional 120 W tool resistance to ground in parallel max load / max tau 200 W / 20 nF ELECTRICAL CHARACTERISTICS (5.0 V ≤ VBAT ≤ 27 V, −40°C ≤ TA ≤ 125°C, unless otherwise specified.) AC CHARACTERISTICS (See Figures 4, 5, and 6) Characteristic Symbol Condition Min Typ Max Unit Transmit Delay in Normal and Wake−Up Mode, Bus Rising Edge (Notes 12, 13) tTr Min and Max Loads per Timing Measurement Load Conditions 2.0 − 6.3 ms Transmit Delay in Wake−Up Mode to VihWU, Bus Rising Edge (Notes 12, 14) tTWUr Min and Max Loads per Timing Measurement Load Conditions 2.0 − 18 ms Transmit Delay in Normal Mode, Bus Falling Edge (Notes 15, 16) tTf Min and Max Loads per Timing Measurement Load Conditions 1.8 − 10 ms Transmit Delay in Wake−Up Mode, Bus Falling Edge (Notes 15, 16) tTWU1f Min and Max Loads per Timing Measurement Load Conditions 3.0 − 13.7 ms Transmit Delay in High−Speed Mode, Bus Rising Edge (Notes 12, 17) tTHSr Min and Max Loads per Timing Measurement Load Conditions 0.1 − 1.5 ms Transmit Delay in High−Speed Mode, Bus Falling Edge (Notes 16, 18) tTHSf Min and Max Loads per Timing Measurement Load Conditions 0.04 − 3.0 ms Receive Delay, All Active Modes (Note 19) tDR CANH High to Low Transition 0.3 − 1.0 ms Receive Delay, All Active Modes (Note 19) tRD CANH Low to High Transition 0.3 − 1.0 ms Input Minimum Pulse Length, All Active Modes (Note 17) tmpDR tmpRD CANH High to Low Transition CANH Low to High Transition 0.1 0.1 − − 1.0 1.0 ms Wake−Up Filter Time Delay tWUF See Figure 5 10 − 70 ms Receive Blanking Time, After TxD L−H Transition trb See Figure 6 0.5 − 6.0 ms TxD Timeout Reaction Time ttout Normal and High−Speed Mode − 17 − ms TxD Timeout Reaction Time ttoutwu Wake−Up Mode − 17 − ms Delay from Normal to High−Speed and High Voltage Wake−Up Mode tdnhs − − − 30 ms Delay from High−Speed and High Voltage Wake−Up to Normal Mode tdhsn − − − 30 ms Delay from Normal to Standby Mode tdsby VBAT = 6.0 V to 27 V − − 500 ms Delay from Sleep to Normal Mode tdsnwu VBAT = 6.0 V to 27 V − − 50 ms Delay from Sleep to High Voltage Mode tdshv VBAT = 6.0 V to 27 V − − 50 ms Delay from Standby to Sleep Mode (Note 20) tdsleep VBAT = 6.0 V to 27 V 100 250 500 ms 12. Minimum signal delay time is measured from the TxD voltage threshold to CANH = 1.0 V. t load should be min per the Timing Measurement Load Conditions table. 13. Maximum signal delay time is measured from the TxD voltage threshold to CANH = 3.5 V at VBAT = 27 V, CANH = 2.8 V at VBAT = 5.0 V. t load should be max per the Timing Measurement Load Conditions table. 14. Maximum signal delay time is measured from the TxD voltage threshold to CANH = 9.2 V. Vihwumax = Vihwufix, max + Vgoff = 7.9 V + 1.3 V = 9.2 V. t load should be max per the Timing Measurement Load Conditions table. 15. Minimum signal delay time is measured from the TxD voltage threshold to CANH = 3.5 V at VBAT = 27 V, CANH = 2.8 V at VBAT = 5.0 V. t load should be min per the Timing Measurement Load Conditions table. 16. Maximum signal delay time is measured from the TxD voltage threshold to CANH = 1 V. t load should be max per the Timing Measurement Load Conditions table. 17. Maximum signal delay time is measured from the TxD voltage threshold to CANH = 3.5 V. t load should be max per the Timing Measurement Load Conditions table. 18. Minimum signal delay time is measured from the TxD voltage threshold to CANH = 3.5 V. t load should be min per the Timing Measurement Load Conditions table. 19. Receive delay time is measured from the rising / falling edge crossing of the nominal Vih value on CANH to the falling (Vcmos_il_max) / rising (Vcmos_ih_min) edge of RxD. This parameter is tested by applying a square wave signal to CANH. The minimum slew rate for the bus rising and falling edges is 50 V/ ms. The low level on bus is always 0 V. For normal mode and high−speed mode testing the high level on bus is 4 V. For HVWU mode testing the high level on bus is VBAT − 2 V. Relaxation of this non−critical parameter from 0.15 ms to 0.10 ms may be addressed in future revisions of GMW3089. 20. Tested on 14 Pin package only. |
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