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NCP1252BDR2G Datasheet(PDF) 2 Page - ON Semiconductor

Part # NCP1252BDR2G
Description  Current Mode PWM Controller for Forward and Flyback Applications
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NCP1252BDR2G Datasheet(HTML) 2 Page - ON Semiconductor

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NCP1252
www.onsemi.com
2
Vout
NCP1252
Vbulk
Vcc
1
2
3
4
8
6
7
5
100 nF*
*Minimum recommended
decoupling capacitor value
Figure 1. Typical Application
Table 1. PIN FUNCTIONS
Pin No.
Pin Name
Function
Pin Description
1
FB
Feedback
This pin directly connects to an optocoupler collector.
2
BO
Brown−out input
This pin monitors the input voltage image to offer a Brown−out protection.
3
CS
Current sense
Monitors the primary current and allows the selection of the ramp com-
pensation amplitude.
4
RT
Timing element
A resistor connected to ground fixes the switching frequency.
5
GND
The controller ground pin.
6
Drv
Driver
This pin connects to the MOSFET gate
7
VCC
VCC
This pin accepts voltage range from 8 V up to 28 V
8
SSTART
Soft−start
A capacitor connected to ground selects the soft−start duration. The soft
start is grounded during the delay timer
Table 2. MAXIMUM RATINGS TABLE (Notes 1 and 2)
Symbol
Rating
Value
Unit
VCC
Power Supply voltage, Vcc pin, transient voltage: 10 ms with IVcc < 20 mA
30
V
VCC
Power Supply voltage, Vcc pin, continuous voltage
28
V
IVcc
Maximum current injected into pin 7
20
mA
Maximum voltage on low power pins (except pin 6, 7)
−0.3 to 10
V
RθJA – PDIP8
Thermal Resistance Junction−to−Air – PDIP8
131
°C/W
RθJA – SOIC8
Thermal Resistance Junction−to−Air – SOIC8
169
°C/W
TJMAX
Maximum Junction Temperature
150
°C
Storage Temperature Range
−60 to +150
°C
ESD Capability, HBM model
1.8
kV
ESD Capability, Machine Model
200
V
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. This device series contains ESD protection and exceeds the following tests: Human Body Model 1800 V per JEDEC Standard
JESD22−A114E. Machine Model Method 200 V per JEDEC Standard JESD22−A115A.
2. This device contains latch−up protection and exceeds 100 mA per JEDEC Standard JESD78.


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