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NCP1207DR2G Datasheet(PDF) 3 Page - ON Semiconductor

Part # NCP1207DR2G
Description  PWM Current-Mode Controller for Free Running Quasi-Resonant Operation
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NCP1207DR2G Datasheet(HTML) 3 Page - ON Semiconductor

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NCP1207
http://onsemi.com
3
Figure 2. Internal Circuit Architecture
+
VCC
HV
GND
Drv
Demag
+
Fault
Mngt.
+
7.0
mA
To Internal
Supply
+
12 V, 10 V,
5.3 V (fault)
PON
4.5
ms
Delay
+
+
5.0 V
OVP
/1.44
8.0
ms
Blanking
+
5.0
ms
Timeout
Demag
Demag
Overload?
Timeout
Reset
S
R
S*
Q
R*
Q
380 ns
L.E.B.
/3
1.0 V
10 V
50 mV
CS
FB
200
mA
when Drv
is OFF
Driver: src = 20
sink = 10
*S and R are level triggered whereas S is edge
triggered. R has priority over the other inputs.
VCC
Resd
Rint
4.2 V
Soft−Start = 1 ms
MAXIMUM RATINGS
Rating
Symbol
Value
Units
Power Supply Voltage
VCC, Drv
16
V
Maximum Voltage on all other pins except Pin 8 (HV), Pin 6 (VCC) Pin 5 (Drv) and
Pin 1 (Demag)
−0.3 to 10
V
Maximum Current into all pins except VCC (6), HV (8) and Demag (1) when 10 V
ESD diodes are activated
5.0
mA
Maximum Current in Pin 1
Idem
+3.0/−2.0
mA
Thermal Resistance, Junction−to−Case
RqJC
57
°C/W
Thermal Resistance, Junction−to−Air, SOIC version
RqJA
178
°C/W
Thermal Resistance, Junction−to−Air, PDIP version
RqJA
100
°C/W
Maximum Junction Temperature
TJMAX
150
°C
Temperature Shutdown
155
°C
Hysteresis in Shutdown
30
°C
Storage Temperature Range
−60 to +150
°C
ESD Capability, HBM Model (All pins except HV)
2.0
kV
ESD Capability, Machine Model
200
V
Maximum Voltage on Pin 8 (HV), Pin 6 (VCC) decoupled to ground with 10 mF
VHVMAX
500
V
Minimum Voltage on Pin 8 (HV), Pin 6 (VCC) decoupled to ground with 10 mF
VHVMIN
40
V
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.


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