©2011 Fairchild Semiconductor Corporation

2

www.fairchildsemi.com

FFPF08S60ST Rev. C2

Notes:

1. Pulse : Test Pulse width = 300

s, Duty Cycle = 2%

Test Circuit and Waveforms

Parameter

Conditions

Min.

Typ.

Max

Unit

-

-

2.1

1.6

2.6

-

V

V

-

-

-

-

100

500

A

A

-

25

ns

S factor

-

-

-

19

2.2

0.6

21

30

-

-

-

ns

A

nC

S factor

-

-

-

58

4.3

1.3

125

-

-

-

-

ns

A

nC

Avalanche Energy (L = 40 mH)

20

-

-

mJ

Figure 1. Diode Reverse Recovery Test Circuit & Waveform

Figure 2. Unclamped Inductive Switching Test Circuit & Waveform