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IS42VS16100E-75BL Datasheet(PDF) 7 Page - Integrated Silicon Solution, Inc |
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IS42VS16100E-75BL Datasheet(HTML) 7 Page - Integrated Silicon Solution, Inc |
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7 / 81 page  IS42VS16100E Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 7 Rev. 00E 01/21/2011 ACCHARACTERISTICS(1,2,3,6) -7.5 -10 Symbol Parameter Min.Max. Min.Max. Units tck3 ClockCycleTime CAS Latency=3 7.5— 10— ns tck2 CAS Latency=2 10— 12— ns tac3 AccessTimeFromCLK(4) CAS Latency=3 —6 —7 ns tac2 CAS Latency=2 —8 —8 ns tchi CLKHIGHLevelWidth 2.5— 3— ns tcl CLKLOWLevelWidth 2.5— 3— ns tOh3 OutputDataHoldTime CAS Latency=3 2— 2— ns tOh2 CAS Latency=2 2— 2— ns tlz OutputLOWImpedanceTime 0— 0— ns thz3 OutputHIGHImpedanceTime(5) CAS Latency=3 —6 —7 ns thz2 CAS Latency=2 —8 —8 ns tDs InputDataSetupTime 2— 2— ns tDh InputDataHoldTime 1— 1— ns tas AddressSetupTime 2— 2— ns tah AddressHoldTime 1— 1— ns tcks CKESetupTime 2— 2.5— ns tckh CKEHoldTime 1— 1— ns tcka CKEtoCLKRecoveryDelayTime 1CLK+3 — 1CLK+3 — ns tcs CommandSetupTime(CS,RAS,CAS,WE,DQM) 2— 2— ns tch CommandHoldTime(CS,RAS,CAS,WE,DQM) 1— 1— ns trc CommandPeriod(REFtoREF/ACTtoACT) 75— 100— ns tras CommandPeriod(ACTtoPRE) 45 100,000 60 100,000 ns trp CommandPeriod(PREtoACT) 22.5— 30— ns trcD ActiveCommandToRead/WriteCommandDelayTime 22.5— 30— ns trrD CommandPeriod(ACT[0]toACT[1]) 15— 20— ns tDpl3 InputDataToPrecharge CAS Latency=3 2CLK — 2CLK— ns CommandDelaytime tDpl2 CAS Latency=2 2CLK — 2CLK— ns tDal3 InputDataToActive/Refresh CAS Latency=3 2CLK+trp — 2CLK+trp — ns CommandDelaytime(DuringAuto-Precharge) tDal2 CAS Latency=2 2CLK+trp — 2CLK+trp — ns tt TransitionTime 0.55 0.55 ns tref RefreshCycleTime(2048) —32 —32 ms Notes: 1.Thepower-onsequencemustbeexecutedbeforestartingmemoryoperation. 2.measuredwithtt =0.5ns. 3.Thereferencelevelis0.9Vwhenmeasuringinputsignaltiming.RiseandfalltimesaremeasuredbetweenVih (min.)andVil (max.). 4.Accesstimeismeasuredat0.9Vwiththeloadshowninthefigurebelow. 5.Thetimethz (max.)isdefinedasthetimerequiredfortheoutputvoltagetobecomehighimpedance. 6.Notallparametersaretestedatthewaferlevel,buttheparametershavebeenpreviouslycharacterized. |
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