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LP38513 Datasheet(PDF) 4 Page - Texas Instruments |
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LP38513 Datasheet(HTML) 4 Page - Texas Instruments |
4 / 25 page LP38513 SNVS361E – JULY 2007 – REVISED NOVEMBER 2015 www.ti.com 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) (2) MIN MAX UNIT IN pin voltage (survival) −0.3 6 V EN pin voltage (survival) −0.3 6 V OUT pin Voltage (survival) −0.3 6 V ERROR pin voltage (survival) −0.3 6 V IOUT (Survival) Internally limited Power dissipation(3) Internally limited Storage temperature, Tstg −65 150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) If Military/Aerospace specified devices are required, contact the TI Sales Office/ Distributors for availability and specifications. (3) Device operation must be evaluated, and derated as needed, based on ambient temperature (TA), power dissipation (PD), maximum allowable operating junction temperature (TJ(MAX)), and package thermal resistance (RθJA). 6.2 ESD Ratings VALUE UNIT V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±2000 V (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. 6.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) (1) MIN NOM MAX UNIT Input supply voltage, VIN 2.25 5.5 V Enable input voltage, VEN 0 5.5 V ERROR pin voltage 0 VIN V Output current (DC) 0 3 mA/A Junction temperature(2) −40 125 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) Device operation must be evaluated, and derated as needed, based on ambient temperature (TA), power dissipation (PD), maximum allowable operating junction temperature (TJ(MAX)), and package thermal resistance (RθJA). 6.4 Thermal Information LP38513 THERMAL METRIC(1) NDH (TO-220) KTT (DDPAK/TO-263) UNIT 5 PINS 5 PINS RθJA Junction-to-ambient thermal resistance 31.9 32.9 °C/W RθJC(top) Junction-to-case (top) thermal resistance 43.7 37.6 °C/W RθJB Junction-to-board thermal resistance 16.4 18.9 °C/W ψJT Junction-to-top characterization parameter 8.3 5.7 °C/W ψJB Junction-to-board characterization parameter 16.4 17.3 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance 1.2 1.0 °C/W (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report, SPRA953. 4 Submit Documentation Feedback Copyright © 2007–2015, Texas Instruments Incorporated Product Folder Links: LP38513 |
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