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LM536003QDSXRQ1 Datasheet(PDF) 33 Page - Texas Instruments |
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LM536003QDSXRQ1 Datasheet(HTML) 33 Page - Texas Instruments |
33 / 44 page 33 LM53600-Q1, LM53601-Q1 www.ti.com SNAS660B – JUNE 2015 – REVISED FEBRUARY 2016 Product Folder Links: LM53600-Q1 LM53601-Q1 Submit Documentation Feedback Copyright © 2015–2016, Texas Instruments Incorporated 12.5 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 12.6 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. |
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