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54LS109 Datasheet(PDF) 3 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part No. 54LS109
Description  Dual Positive-Edge-Triggered J-K Flip-Flops with Preset, Clear, and Complementary Outputs
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Maker  NSC [National Semiconductor (TI)]
Homepage  http://www.national.com
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54LS109 Datasheet(HTML) 3 Page - National Semiconductor (TI)

   
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Electrical Characteristics over recommended operating free air temperature range (unless otherwise noted)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
(Note 1)
VI
Input Clamp Voltage
VCC e Min II eb18 mA
b
15
V
VOH
High Level Output
VCC e Min IOH e Max
DM54
25
34
V
Voltage
VIL e Max VIH e Min
DM74
27
34
VOL
Low Level Output
VCC e Min IOL e Max
DM54
025
04
Voltage
VIL e Max VIH e Min
DM74
035
05
V
IOL e 4 mA VCC e Min
DM74
025
04
II
Input Current
Max
VCC e Max
J K
01
Input Voltage
VI e 7V
Clock
01
mA
Preset
02
Clear
02
IIH
High Level Input
VCC e Max
JK
20
Current
VI e 27V
Clock
20
m
A
Preset
40
Clear
40
IIL
Low Level Input
VCC e Max
J K
b
04
Current
VI e 04V
Clock
b
04
mA
Preset
b
08
Clear
b
08
IOS
Short Circuit
VCC e Max
DM54
b
20
b
100
mA
Output Current
(Note 2)
DM74
b
20
b
100
ICC
Supply Current
VCC e Max (Note 3)
4
8
mA
Switching Characteristics at VCC e 5V and TA e 25 C (See Section 1 for Test Waveforms and Output Load)
From (Input)
RL e 2kX
Symbol
Parameter
To (Output)
CL e 15 pF
CL e 50 pF
Units
Min
Max
Min
Max
fMAX
Maximum Clock
25
20
MHz
Frequency
tPLH
Propagation Delay Time
Clock to
25
35
ns
Low to High Level Output
Q or Q
tPHL
Propagation Delay Time
Clock to
30
35
ns
High to Low Level Output
Q or Q
tPLH
Propagation Delay Time
Clear
25
35
ns
Low to High Level Output
to Q
tPHL
Propagation Delay Time
Clear
30
35
ns
High to Low Level Output
to Q
tPLH
Propagation Delay Time
Preset
25
35
ns
Low to High Level Output
to Q
tPHL
Propagation Delay Time
Preset
30
35
ns
High to Low Level Output
to Q
Note 1
All typicals are at VCC e 5V TA e 25 C
Note 2
Not more than one output should be shorted at a time and the duration should not exceed one second For devices with feedback from the outputs where
shorting the outputs to ground may cause the outputs to change logic state an equivalent test may be performed where VO e 225V and 2125V for DM54 and
DM74 series respectively with the minimum and maximum limits reduced by one half from their stated values This is very useful when using automatic test
equipment
Note 3
ICC is measured with all outputs open with CLOCK grounded after setting the Q and Q outputs high in turn
3


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