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TLC59291 Datasheet(PDF) 4 Page - Texas Instruments |
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TLC59291 Datasheet(HTML) 4 Page - Texas Instruments |
4 / 45 page TLC59291 SLVSA96 – SEPTEMBER 2015 www.ti.com Pin Functions (continued) PIN NAME NO. I/O DESCRIPTION OUT0 2 O OUT1 3 O OUT2 4 O OUT3 5 O OUT4 6 O OUT5 7 O OUT6 8 O Constant-current sink outputs. OUT7 9 O Multiple outputs can be configured in parallel to increase the constant-current capability. Different OUT8 10 O voltages can be applied to each output. OUT9 11 O OUT10 12 O OUT11 13 O OUT12 14 O OUT13 15 O OUT14 16 O OUT15 17 O Serial data shift clock. Data present on SIN are shifted to the LSB of the 16-bit shift register with the SCKI rising edge. Data SCLK 24 I in the shift register are shifted toward the MSB at each SCLK rising edge. The MSB data of the common shift register appear on SOUT. Serial data input for the 16-bit common shift register. SIN 23 I When SIN is high, a '1' is written to the LSB of the common shift register at the rising edge of SCLK. Serial data output of the 16-bit common shift register. When FC9(BLANK Mode) = 0 and BLANK = LOW; SOUT is connected to the bit 7 of the 16-bit shift register. Data are clocked out at the SCLK rising SOUT 19 O edge. In other case: SOUT is connected to the bit 15 of the 16-bit shift register. Data are clocked out at the SCLK rising edge. VCC 21 — Power-supply voltage 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) VALUE MIN MAX UNIT Supply voltage, VCC (2) –0.3 6 V Input voltage SIN, SCLK, LAT, BLANK, IREF –0.3 VCC + 0.3 V SOUT –0.3 VCC + 0.3 V Output voltage OUT0 to OUT15 –0.3 11 V Output current (DC) OUT0 to OUT15 65 mA Operating junction temperature, TJ (max) 150 °C Storage temperature, TSTG –55 150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) All voltages are with respect to device ground terminal. 4 Submit Documentation Feedback Copyright © 2015, Texas Instruments Incorporated Product Folder Links: TLC59291 |
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