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RHD5930-7 Datasheet(PDF) 2 Page - Aeroflex Circuit Technology

Part # RHD5930-7
Description  RadHard-by-Design RHD5930 Digital-to-Analog Converter 11-Bit Ladder Output
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Manufacturer  AEROFLEX [Aeroflex Circuit Technology]
Direct Link  http://www.aeroflex.com
Logo AEROFLEX - Aeroflex Circuit Technology

RHD5930-7 Datasheet(HTML) 2 Page - Aeroflex Circuit Technology

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SCD5930 Rev A 1/29/14
Aeroflex Plainview
ABSOLUTE MAXIMUM RATINGS
Parameter
Range
Units
Case Operating Temperature Range
-55 to +125
°C
Storage Temperature Range
-65 to +150
°C
Junction Temperature
+150
°C
Lead Temperature (soldering, 10 seconds)
300
°C
Thermal Resistance, Junction to Case,
jc
7
°C/W
Supply Voltage
+VCC
+6.0
V
PREF relative to NREF
+6.0
V
Digital Input Voltage
VCC +0.4
GND -0.4
V
ESD Rating (MIL-STD-883, Method 3015, Class 2)
2,000 - 3,999
V
Power @25°C
200
mW
NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress rating only;
functional operation beyond the “Operation Conditions” is not recommended and extended exposure beyond the “Operation Conditions” may affect
device reliability.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Typical
Units
+VCC
Power Supply Voltage
3.3 to 5.0
V
ELECTRICAL PERFORMANCE CHARACTERISTICS
(Tc = -55°C to +125°C, +Vcc = +5.0V -- Unless otherwise specified)
Parameter
Symbol
Conditions
Min
Max
Units
Resolution 2/
N
11
Bits
Supply Current
ICC
Toggle inputs, VCC, GND
1
mA
Quiescent current
ICCQ
All inputs = VCC
1mA
Relative Accuracy
RA
PREF = VCC, NREF = GND
0.25
% of
FSR
Gain Error
AE
PREF = VCC, NREF = GND
0.55
% of
FSR
Offset Error
OFF2
PREF = 4.9 V, NREF = 0.1 V
0.25
% of
FSR
Differential Nonlinearity
DNL
PREF = VCC, NREF = GND
0.25
% of
FSR
Output Settling Time
TD
All inputs = Gnd to VCC,
PREF = 4.9 V, NREF = 0.1 V,
Output = 1/2 LSB of Nominal
3us
PREF Input Z
ZP
3
7k
NREF Input Z
ZR
3
7k
Input High Voltage
VIH
PREF = 4.9 V, NREF = 0.1 V
3.5
V
Input Low Voltage
VIL
PREF = 4.9 V, NREF = 0.1 V
1.5
V
Input High Leakage 3/
IIH
Input under test = GND
1
nA
Input Low Leakage 3/
IIL
Input under test = VCC
1nA
Note: 1/ Specification derated to reflect Total Dose exposure to 1 Mrad(Si) @ +25°C.
2/ Not Tested. Shall be guaranteed by design, characterization, or correlation to other test parameters.
3/ Not Tested.


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